loadpatents
name:-0.046653032302856
name:-0.050165891647339
name:-0.0027308464050293
Blatchford; James Walter Patent Filings

Blatchford; James Walter

Patent Applications and Registrations

Patent applications and USPTO patent grants for Blatchford; James Walter.The latest application filed is for "sram layout for double patterning".

Company Profile
2.55.47
  • Blatchford; James Walter - Richardson TX
  • Blatchford; James Walter - Saratoga Springs NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Sram Layout For Double Patterning
App 20210028179 - Blatchford; James Walter
2021-01-28
SRAM layout for double patterning
Grant 10,840,250 - Blatchford November 17, 2
2020-11-17
Rectangular via for ensuring via yield in the absence of via redundancy
Grant 10,741,489 - Blatchford A
2020-08-11
Sram Layout For Double Patterning
App 20190109143 - Blatchford; James Walter
2019-04-11
SRAM layout for double patterning
Grant 10,181,474 - Blatchford Ja
2019-01-15
SRAM layout for double patterning
Grant 10,103,153 - Blatchford October 16, 2
2018-10-16
Metal on elongated contacts
Grant 10,103,171 - Blatchford , et al. October 16, 2
2018-10-16
Elongated contacts using litho-freeze-litho-etch process
Grant 10,043,714 - Blatchford , et al. August 7, 2
2018-08-07
Method to form silicide and contact at embedded epitaxial facet
Grant 10,008,499 - Lim , et al. June 26, 2
2018-06-26
Method of forming a transistor with an active area layout having both wide and narrow area portions and a gate formed over the intersection of the two
Grant 9,899,364 - Blatchford , et al. February 20, 2
2018-02-20
Method To Form Silicide And Contact At Embedded Epitaxial Facet
App 20180047728 - LIM; Kwan-Yong ;   et al.
2018-02-15
Method to form silicide and contact at embedded epitaxial facet
Grant 9,812,452 - Lim , et al. November 7, 2
2017-11-07
Elongated Contacts Using Litho-freeze-litho-etch Process
App 20170178966 - BLATCHFORD; James Walter ;   et al.
2017-06-22
Elongated contacts using litho-freeze-litho-etch process
Grant 9,620,419 - Blatchford , et al. April 11, 2
2017-04-11
Method To Form Silicide And Contact At Embedded Epitaxial Facet
App 20170047329 - LIM; Kwan-Yong ;   et al.
2017-02-16
Method to form silicide and contact at embedded epitaxial facet
Grant 9,508,601 - Lim , et al. November 29, 2
2016-11-29
Metal On Elongated Contacts
App 20160190156 - BLATCHFORD; James Walter ;   et al.
2016-06-30
Elongated Contacts Using Litho-freeze-litho-etch Process
App 20160190016 - BLATCHFORD; James Walter ;   et al.
2016-06-30
Metal on elongated contacts
Grant 9,312,170 - Blatchford , et al. April 12, 2
2016-04-12
Elongated contacts using litho-freeze-litho-etch process
Grant 9,305,848 - Blatchford , et al. April 5, 2
2016-04-05
Sram Layout For Double Patterning
App 20160020214 - BLATCHFORD; James Walter
2016-01-21
Layout Method To Minimize Context Effects And Die Area
App 20150332974 - Blatchford; James Walter ;   et al.
2015-11-19
Layout method to minimize context effects and die area
Grant 9,123,562 - Blatchford , et al. September 1, 2
2015-09-01
Method for ensuring DPT compliance for auto-routed via layers
Grant 9,112,000 - Blatchford August 18, 2
2015-08-18
Elongated Contacts Using Litho-freeze-litho-etch Process
App 20150170975 - BLATCHFORD; James Walter ;   et al.
2015-06-18
Method To Form Silicide And Contact At Embedded Epitaxial Facet
App 20150170972 - LIM; Kwan-Yong ;   et al.
2015-06-18
Metal On Elongated Contacts
App 20150170962 - BLATCHFORD; James Walter ;   et al.
2015-06-18
Two-track cross-connect in double-patterned structure using rectangular via
Grant 9,024,450 - Blatchford , et al. May 5, 2
2015-05-05
System for controlling SiGe-to-gate spacing
Grant 8,828,833 - Blatchford , et al. September 9, 2
2014-09-09
Method to ensure double patterning technology compliance in standard cells
Grant 8,756,550 - Blatchford June 17, 2
2014-06-17
Method for generating ultra-short-run-length dummy poly features
Grant 8,751,977 - Blatchford June 10, 2
2014-06-10
Perturbational technique for co-optimizing design rules and illumination conditions for lithography process
Grant 8,745,548 - Blatchford June 3, 2
2014-06-03
Method for ensuring DPT compliance with autorouted metal layers
Grant 8,707,223 - Blatchford April 22, 2
2014-04-22
Perturbational Technique For Co-optimizing Design Rules And Illumination Conditions For Lithography Process
App 20140101622 - BLATCHFORD; James Walter
2014-04-10
Gate CD control using local design on both sides of neighboring dummy gate level features
Grant 8,667,432 - Blatchford , et al. March 4, 2
2014-03-04
Gate CD control using local design on both sides of neighboring dummy gate level features
Grant 8,663,879 - Blatchford , et al. March 4, 2
2014-03-04
Two-track Cross-connect In Double-patterned Structure Using Rectangular Via
App 20140035160 - BLATCHFORD; James Walter ;   et al.
2014-02-06
Dual alignment strategy for optimizing contact layer alignment
Grant 8,603,905 - Blatchford December 10, 2
2013-12-10
Perturbational technique for co-optimizing design rules and illumination conditions for lithography process
Grant 8,607,170 - Blatchford December 10, 2
2013-12-10
Two-track cross-connect in double-patterned structure using rectangular via
Grant 8,580,675 - Blatchford , et al. November 12, 2
2013-11-12
Manufacturability enhancements for gate patterning process using polysilicon sub layer
Grant 8,584,053 - Blatchford November 12, 2
2013-11-12
Pattern-split decomposition strategy for double-patterned lithography process
Grant 8,575,020 - Blatchford November 5, 2
2013-11-05
Gate Cd Control Using Local Design On Both Sides Of Neighboring Dummy Gate Level Features
App 20130246983 - BLATCHFORD; James Walter ;   et al.
2013-09-19
Gate Cd Control Using Local Design On Both Sides Of Neighboring Dummy Gate Level Features
App 20130244144 - BLATCHFORD; James Walter ;   et al.
2013-09-19
Flexible integration of logic blocks with transistors of different threshold voltages
Grant 8,513,105 - Baldwin , et al. August 20, 2
2013-08-20
Two-track cross-connects in double-patterned metal layers using a forbidden zone
Grant 8,461,038 - Blatchford June 11, 2
2013-06-11
Gate CD control using local design on both sides of neighboring dummy gate level features
Grant 8,455,180 - Blatchford , et al. June 4, 2
2013-06-04
Illumination And Design Rule Method For Double Patterned Slotted Contacts
App 20130069170 - Blatchford; James Walter
2013-03-21
Method For Ensuring DPT Compliance for Auto-Routed Via Layers
App 20130072020 - Blatchford; James Walter
2013-03-21
Method To Ensure Double Patterning Technology Compliance In Standard Cells
App 20130074029 - Blatchford; James Walter
2013-03-21
Rectangular Via For Ensuring Via Yield In The Absence Of Via Redundancy
App 20130069244 - Blatchford; James Walter
2013-03-21
Layout Method To Minimize Context Effects and Die Area
App 20130069081 - Blatchford; James Walter ;   et al.
2013-03-21
Method For Ensuring Dpt Compliance With Autorouted Metal Layers
App 20130074028 - BLATCHFORD; James Walter
2013-03-21
Sram Layout For Double Patterning
App 20130069168 - Blatchford; James Walter
2013-03-21
Hybrid pitch-split pattern-split lithography process
Grant 8,372,743 - Blatchford February 12, 2
2013-02-12
Manufacturability Enhancements For Gate Patterning Process Using Polysilicon Sub Layer
App 20120331425 - Blatchford; James Walter
2012-12-27
Gate line edge roughness reduction by using 2P/2E process together with high temperature bake
Grant 8,304,317 - Gu , et al. November 6, 2
2012-11-06
Perturbational Technique For Co-optimizing Design Rules And Illumination Conditions For Lithography Process
App 20120227015 - Blatchford; James Walter
2012-09-06
Two-track Cross-connect In Double-patterned Structure Using Rectangular Via
App 20120223439 - Blatchford; James Walter ;   et al.
2012-09-06
Pattern-split Decomposition Strategy For Double-patterned Lithography Process
App 20120225551 - Blatchford; James Walter
2012-09-06
Hybrid Pitch-split Pattern-split Lithography Process
App 20120225550 - Blatchford; James Walter
2012-09-06
Two-track Cross-connects In Double-patterned Metal Layers Using A Forbidden Zone
App 20120225552 - Blatchford; James Walter
2012-09-06
Diagonal Interconnect For Improved Process Margin With Off-axis Illumination
App 20120148942 - Blatchford; James Walter
2012-06-14
Method For Generating Ultra-short-run-length Dummy Poly Features
App 20120131522 - Blatchford; James Walter
2012-05-24
Layout of printable assist features to aid transistor control
Grant 8,176,443 - Rathsack , et al. May 8, 2
2012-05-08
Gate Cd Control Using Local Design On Both Sides Of Neighboring Dummy Gate Level Features
App 20120107729 - Blatchford; James Walter ;   et al.
2012-05-03
ICs with end gates having adjacent electrically connected field poly
Grant 8,138,074 - Blatchford March 20, 2
2012-03-20
Method for layout of random via arrays in the presence of strong pitch restrictions
Grant 8,051,391 - Blatchford November 1, 2
2011-11-01
System and method for making photomasks
Grant 7,930,656 - Aton , et al. April 19, 2
2011-04-19
Use of dual mask processing of different composition such as inorganic/organic to enable a single poly etch using a two-print-two-etch approach
Grant 7,910,289 - Rathsack , et al. March 22, 2
2011-03-22
EDA methodology for extending ghost feature beyond notched active to improve adjacent gate CD control using a two-print-two-etch approach
Grant 7,807,343 - Rathsack , et al. October 5, 2
2010-10-05
Method of achieving dense-pitch interconnect patterning in integrated circuits
Grant 7,790,525 - Prins , et al. September 7, 2
2010-09-07
Methods for adjusting shifter width of an alternating phase shifter having variable width
Grant 7,774,739 - Blatchford , et al. August 10, 2
2010-08-10
Gate line edge roughness reduction by using 2P/2E process together with high temperature bake
App 20100167484 - Gu; Yiming ;   et al.
2010-07-01
Dual Alignment Strategy For Optimizing Contact Layer Alignment
App 20100167513 - Blatchford; James Walter
2010-07-01
Method for performing place-and-route of contacts and vias in technologies with forbidden pitch requirements
Grant 7,745,067 - Blatchford , et al. June 29, 2
2010-06-29
Two-print two-etch method for enhancement of CD control using ghost poly
Grant 7,737,016 - Blatchford , et al. June 15, 2
2010-06-15
Method For Layout Of Random Via Arrays In The Presence Of Strong Pitch Restrictions
App 20100031216 - BLATCHFORD; James Walter
2010-02-04
Design Layout Of Printable Assist Features To Aid Transistor Control
App 20090300567 - Rathsack; Benjamen Michael ;   et al.
2009-12-03
Gate critical dimension variation by use of ghost features
Grant 7,569,309 - Blatchford , et al. August 4, 2
2009-08-04
System And Method For Making Photomasks
App 20090125865 - Aton; Thomas J. ;   et al.
2009-05-14
Method of Achieving Dense-Pitch Interconnect Patterning in Integrated Circuits
App 20090101983 - Prins; Steven Lee ;   et al.
2009-04-23
Eda Methodology For Extending Ghost Feature Beyond Notched Active To Improve Adjacent Gate Cd Control Using A Two-print-two-etch Approach
App 20080166889 - Rathsack; Benjamen Michael ;   et al.
2008-07-10
Maximum/variable Shifter Widths To Allow Alternating Phase-shift Implementation For Dense Or Existing Layouts
App 20080134128 - BLATCHFORD; James Walter ;   et al.
2008-06-05
Two-print-two-etch method for enhancement of CD control using ghost poly
App 20080014684 - Blatchford; James Walter ;   et al.
2008-01-17
Use of dual mask processing of different composition such as inorganic/organic to enable a single poly etch using a two-print-two-etch approach
App 20070161245 - Rathsack; Benjamen Michael ;   et al.
2007-07-12
Gate critical dimension variation by use of ghost features
App 20070105387 - Blatchford; James Walter ;   et al.
2007-05-10
Reduction of mechanical stress on pattern specific geometries during etch using double pattern layout and process approach
App 20070099424 - Rathsack; Benjamen Michael ;   et al.
2007-05-03
Method for performing place-and-route of contacts and vias in technologies with forbidden pitch requirements
App 20070028200 - Blatchford; James Walter ;   et al.
2007-02-01
Layout modification to eliminate line bending caused by line material shrinkage
App 20060292885 - Ukraintsev; Vladimir Alexeevich ;   et al.
2006-12-28

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed