Blaesing-Bangert; Carola

Patent Applications and Registrations

Patent applications and USPTO patent grants for Blaesing-Bangert; Carola.The latest application filed is for "device and method for determining placements of pattern elements of a reflective photolithographic mask in the operating environment thereof".

Company Profile

3.10.8

Blaesing-Bangert; Carola - Rothenstein DE
Blaesing-Bangert; Carola - Kassel DE
Blaesing-Bangert; Carola - Huettenberg DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for transforming measurement data of a photolithographic mask for the EUV range from first surroundings into second surroundings Grant 11,243,464 - Blaesing-Bangert February 8, 2	2022-02-08
Device And Method For Determining Placements Of Pattern Elements Of A Reflective Photolithographic Mask In The Operating Environment Thereof App 20210364908 - Blaesing-Bangert; Carola	2021-11-25
Method for capturing and compensating ambient effects in a measuring microscope Grant 10,585,274 - Seidel , et al.	2020-03-10
Method And Apparatus For Transforming Measurement Data Of A Photolithographic Mask For The Euv Range From First Surroundings Int App 20190377256 - Blaesing-Bangert; Carola	2019-12-12
Method For Capturing And Compensating Ambient Effects In A Measuring Microscope App 20190011690 - Seidel; Dirk ; et al.	2019-01-10
Method for calibrating a position-measuring system and position-measuring system Grant 9,528,825 - Blaesing-Bangert , et al. December 27, 2	2016-12-27
Method for measuring a lithography mask or a mask blank Grant 9,354,048 - Blaesing-Bangert May 31, 2	2016-05-31
Method For Measuring A Lithography Mask Or A Mask Blank App 20150330777 - Blaesing-Bangert; Carola	2015-11-19
Method For Calibrating A Position-measuring System And Position-measuring System App 20150013427 - Blaesing-Bangert; Carola ; et al.	2015-01-15
Substrate holder, and use of the substrate holder in a highly accurate measuring instrument Grant 7,081,963 - Blaesing-Bangert , et al. July 25, 2	2006-07-25
Substrate holder, and use of the substrate holder in a highly accurate measuring instrument Grant 6,816,253 - Blaesing-Bangert , et al. November 9, 2	2004-11-09
Substrate holder, and use of the substrate holder in a highly accurate measuring instrument App 20040179210 - Blaesing-Bangert, Carola ; et al.	2004-09-16
Coordinate measuring stage and coordinate measuring instrument Grant 6,778,260 - Blaesing-Bangert , et al. August 17, 2	2004-08-17
Method and microscope for detecting images of an object App 20040120579 - Cemic, Franz ; et al.	2004-06-24
Coordinate measuring stage and coordinate measuring instrument App 20030053037 - Blaesing-Bangert, Carola ; et al.	2003-03-20
Device and method for delivering various transparent substrates into a high-precision measuring instrument Grant 6,377,870 - Blaesing-Bangert , et al. April 23, 2	2002-04-23
Method and device for measuring structures on a transparent substrate Grant 6,323,953 - Blaesing-Bangert , et al. November 27, 2	2001-11-27
Method for measuring the positions of structures on a mask surface Grant 6,226,087 - Blaesing-Bangert May 1, 2	2001-05-01

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