Bizen; Daisuke

Patent Applications and Registrations

Patent applications and USPTO patent grants for Bizen; Daisuke.The latest application filed is for "charged particle beam system and method for determining observation conditions in charged particle beam device".

Company Profile

9.14.21

Bizen; Daisuke - Tokyo JP
Bizen; Daisuke - Kokubunji JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged particle beam device Grant 11,456,150 - Bizen , et al. September 27, 2	2022-09-27
Charged Particle Beam System and Method For Determining Observation Conditions in Charged Particle Beam Device App 20220246394 - ISHIZAKA; Fumiya ; et al.	2022-08-04
Charged Particle Beam Device App 20220216032 - SHOUJI; Minami ; et al.	2022-07-07
Charged Particle Beam Device App 20220139667 - Shouji; Minami ; et al.	2022-05-05
Charged Particle Beam Apparatus And Control Method App 20220115203 - BIZEN; Kaori ; et al.	2022-04-14
Charged-particle beam apparatus Grant 11,282,671 - Ikeda , et al. March 22, 2	2022-03-22
Pattern Measurement Method, Measurement System, and Computer-Readable Medium App 20210404801 - DOI; Ayumi ; et al.	2021-12-30
Charged particle beam apparatus Grant 11,211,224 - Okai , et al. December 28, 2	2021-12-28
Pattern cross-sectional shape estimation system and program Grant 11,211,226 - Yokosuka , et al. December 28, 2	2021-12-28
Scanning electron microscope and calculation method for three-dimensional structure depth Grant 11,164,720 - Yasui , et al. November 2, 2	2021-11-02
Charged Particle Beam Device App 20210313140 - BIZEN; Kaori ; et al.	2021-10-07
Charged Particle Beam Apparatus App 20210249221 - OKAI; Nobuhiro ; et al.	2021-08-12
Scanning electron microscope and sample observation method using scanning electron microscope Grant 11,011,348 - Bizen , et al. May 18, 2	2021-05-18
Electron beam device Grant 10,825,649 - Sohda , et al. November 3, 2	2020-11-03
Pattern Cross-sectional Shape Estimation System And Program App 20200321189 - YOKOSUKA; Toshiyuki ; et al.	2020-10-08
Scanning Electron Microscope And Calculation Method For Three-dimensional Structure Depth App 20200234916 - YASUI; Kenji ; et al.	2020-07-23
Charged-Particle Beam Apparatus App 20200185189 - IKEDA; Uki ; et al.	2020-06-11
Scanning Electron Microscope And Sample Observation Method Using Scanning Electron Microscope App 20190348255 - BIZEN; Daisuke ; et al.	2019-11-14
Electron Beam Device App 20190295805 - SOHDA; Yasunari ; et al.	2019-09-26
Scanning microscope with controlled variable measurement parameters Grant 10,338,367 - Araki , et al.	2019-07-02
Scanning electron microscope and electron trajectory adjustment method therefor Grant 10,262,830 - Bizen , et al.	2019-04-16
Charged particle beam apparatus Grant 10,217,604 - Sakakibara , et al. Feb	2019-02-26
Charged Particle Beam Apparatus App 20180286629 - SAKAKIBARA; Makoto ; et al.	2018-10-04
Scanning electron microscope and method for controlling same Grant 10,014,160 - Shirahata , et al. July 3, 2	2018-07-03
Charged particle beam device, simulation method, and simulation device Grant 9,966,225 - Bizen , et al. May 8, 2	2018-05-08
Scanning Microscope App 20180067294 - ARAKI; Ryoko ; et al.	2018-03-08
Scanning Electron Microscope And Electron Trajectory Adjustment Method Therefor App 20170263415 - BIZEN; Daisuke ; et al.	2017-09-14
Charged Particle Beam Device, Simulation Method, And Simulation Device App 20170213695 - BIZEN; Daisuke ; et al.	2017-07-27
Scanning Electron Microscope And Method For Controlling Same App 20170186583 - SHIRAHATA; Kaori ; et al.	2017-06-29
Pattern critical dimension measurement equipment and method for measuring pattern critical dimension Grant 9,520,266 - Shirahata , et al. December 13, 2	2016-12-13
Charged particle beam device and measuring method using the same Grant 9,336,984 - Bizen , et al. May 10, 2	2016-05-10
Pattern Critical Dimension Measurement Equipment And Method For Measuring Pattern Critical Dimension App 20150041648 - Shirahata; Kaori ; et al.	2015-02-12
Charged Particle Beam Device And Measuring Method Using The Same App 20140299767 - Bizen; Daisuke ; et al.	2014-10-09
Scanning Electron Microscope And Length Measuring Method Using The Same App 20130292568 - Bizen; Daisuke ; et al.	2013-11-07

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