BISCHOFF; Maarten
Patent Applications and Registrations
Patent applications and USPTO patent grants for BISCHOFF; Maarten.The latest application filed is for "method, device and system for reducing off-axial aberration in electron microscopy".
- BISCHOFF; Maarten - Uden NL
| Patent | Date |
|---|---|
| Method, Device And System For Reducing Off-axial Aberration In Electron Microscopy App 20210272767 - BISCHOFF; Maarten ; et al. | 2021-09-02 |
| Transmission charged particle microscope with imaging beam rotation Grant 10,224,174 - Freitag , et al. | 2019-03-05 |
| Gun Lens Design In A Charged Particle Microscope App 20180323036 - Mohammadi-Gheidari; Ali ; et al. | 2018-11-08 |
| Method for adjusting a stem equipped with an aberration corrector Grant 9,029,767 - Bischoff , et al. May 12, 2 | 2015-05-12 |
| Distortion free stigmation of a TEM Grant 8,569,693 - Bischoff , et al. October 29, 2 | 2013-10-29 |
| Method For Adjusting A Stem Equipped With An Aberration Corrector App 20130105689 - Bischoff; Maarten ; et al. | 2013-05-02 |
| Distortion Free Stigmation of a TEM App 20130062520 - Henstra; Alexander ; et al. | 2013-03-14 |
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