Binns; Martin Jeffrey

Patent Applications and Registrations

Patent applications and USPTO patent grants for Binns; Martin Jeffrey.The latest application filed is for "fabrication of indium-doped silicon by the czochralski method".

Company Profile

0.5.7

Binns; Martin Jeffrey - St. Charles MO

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Fabrication of indium-doped silicon by the czochralski method Grant 10,060,045 - Scala , et al. August 28, 2	2018-08-28
Fabrication Of Indium-doped Silicon By The Czochralski Method App 20160215413 - Scala; Roberto ; et al.	2016-07-28
Indium-doped Silicon Wafer And Solar Cell Using The Same App 20150333193 - Appel; Jesse Samsonov ; et al.	2015-11-19
Control of thermal donor formation in high resistivity CZ silicon App 20050158969 - Binns, Martin Jeffrey ; et al.	2005-07-21
Control of oxygen precipitate formation in high resistivity CZ silicon Grant 6,897,084 - Binns , et al. May 24, 2	2005-05-24
Thermal annealing process for producing low defect density single crystal silicon Grant 6,743,289 - Falster , et al. June 1, 2	2004-06-01
Process for producing thermally annealed wafers having improved internal gettering Grant 6,686,260 - Falster , et al. February 3, 2	2004-02-03
Process for controlling denuded zone depth in an ideal oxygen precipitating silicon wafer App 20030192469 - Libbert, Jeffrey L. ; et al.	2003-10-16
Control of thermal donor formation in high resistivity CZ silicon App 20030054641 - Binns, Martin Jeffrey ; et al.	2003-03-20
Process for producing thermally annealed wafers having improved internal gettering App 20020170631 - Falster, Robert J. ; et al.	2002-11-21
Thermal annealing process for producing low defect density single crystal silicon App 20020083889 - Falster, Robert J. ; et al.	2002-07-04
Thermally annealed wafers having improved internal gettering Grant 6,361,619 - Falster , et al. March 26, 2	2002-03-26

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.