Bijnen; Fransiscus Godefridus Casper

Patent Applications and Registrations

Patent applications and USPTO patent grants for Bijnen; Fransiscus Godefridus Casper.The latest application filed is for "alignment and alignment marks".

Company Profile

0.7.5

Bijnen; Fransiscus Godefridus Casper - Valkenswaard NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Alignment and alignment marks Grant 7,751,047 - Bijnen , et al. July 6, 2	2010-07-06
Optical position assessment apparatus and method Grant 7,477,403 - Gui , et al. January 13, 2	2009-01-13
Lithographic apparatus and device manufacturing method Grant 7,459,247 - Bijnen , et al. December 2, 2	2008-12-02
Alignment method, method of measuring front to backside alignment error, method of detecting non-orthogonality, method of calibration, and lithographic apparatus Grant 7,420,676 - Lof , et al. September 2, 2	2008-09-02
Measurement substrate, substrate table, lithographic apparatus, method of calculating an angle of an alignment beam of an alignment system, and alignment verification method Grant 7,398,177 - Smeets , et al. July 8, 2	2008-07-08
Alignment tool, a lithographic apparatus, an alignment method, a device manufacturing method and device manufactured thereby Grant 7,193,231 - Lof , et al. March 20, 2	2007-03-20
Alignment and alignment marks App 20070031743 - Bijnen; Fransiscus Godefridus Casper ; et al.	2007-02-08
Measurement substrate, substrate table, lithographic apparatus, method of calculating an angle of an alignment beam of an alignment system, and alignment verification method App 20060085161 - Smeets; Erik Marie Jose ; et al.	2006-04-20
Optical position assessment apparatus and method App 20050275840 - Gui, Cheng-Qun ; et al.	2005-12-15
Calibration methods, calibration substrates, lithographic apparatus and device manufacturing methods Grant 6,936,385 - Lof , et al. August 30, 2	2005-08-30
Alignment tool, a lithographic apparatus, an alignment method, a device manufacturing method and device manufactured thereby App 20040108466 - Lof, Joeri ; et al.	2004-06-10
Calibration methods, calibration substrates, lithographic apparatus and device manufacturing methods App 20030224262 - Lof, Joeri ; et al.	2003-12-04

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