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Patent applications and USPTO patent grants for Biewenga; Alexander Sebastian.The latest application filed is for "method for testing a partially assembled multi-die device, integrated circuit die and multi-die device".
Patent | Date |
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Method for testing a partially assembled multi-die device, integrated circuit die and multi-die device Grant 8,829,940 - Jong , et al. September 9, 2 | 2014-09-09 |
Method For Testing A Partially Assembled Multi-die Device, Integrated Circuit Die And Multi-die Device App 20120126846 - Jong; Franciscus Gerardus Maria De ;   et al. | 2012-05-24 |
Integrated Circuit With Test Arrangement, Integrated Circuit Arrangement And Text Method App 20110018550 - De Jong; Franciscus Geradus Maria ;   et al. | 2011-01-27 |
Electronic circuit and method for testing Grant 6,883,129 - Biewenga , et al. April 19, 2 | 2005-04-19 |
Apparatus with a test interface App 20040177300 - Biewenga, Alexander Sebastian ;   et al. | 2004-09-09 |
Electronic circuit and method for testing App 20030051198 - Biewenga, Alexander Sebastian ;   et al. | 2003-03-13 |
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