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name:-0.58012413978577
name:-0.29071712493896
name:-0.01593804359436
Biewenga; Alexander Sebastian Patent Filings

Biewenga; Alexander Sebastian

Patent Applications and Registrations

Patent applications and USPTO patent grants for Biewenga; Alexander Sebastian.The latest application filed is for "method for testing a partially assembled multi-die device, integrated circuit die and multi-die device".

Company Profile
0.3.4
  • Biewenga; Alexander Sebastian - Eindhoven N/A NL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method for testing a partially assembled multi-die device, integrated circuit die and multi-die device
Grant 8,829,940 - Jong , et al. September 9, 2
2014-09-09
Method For Testing A Partially Assembled Multi-die Device, Integrated Circuit Die And Multi-die Device
App 20120126846 - Jong; Franciscus Gerardus Maria De ;   et al.
2012-05-24
Integrated Circuit With Test Arrangement, Integrated Circuit Arrangement And Text Method
App 20110018550 - De Jong; Franciscus Geradus Maria ;   et al.
2011-01-27
Electronic circuit and method for testing
Grant 6,883,129 - Biewenga , et al. April 19, 2
2005-04-19
Apparatus with a test interface
App 20040177300 - Biewenga, Alexander Sebastian ;   et al.
2004-09-09
Electronic circuit and method for testing
App 20030051198 - Biewenga, Alexander Sebastian ;   et al.
2003-03-13

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