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Patent applications and USPTO patent grants for Bieman; Leonard H..The latest application filed is for "machine vision and semiconductor handling".
Patent | Date |
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Scanning phase measuring method and system for an object at a vision station Grant RE39,978 - Bieman January 1, 2 | 2008-01-01 |
Imaging for a machine-vision system Grant 6,956,963 - Ulrich , et al. October 18, 2 | 2005-10-18 |
Detection assembly for detecting dispensed material Grant 6,541,757 - Bieman , et al. April 1, 2 | 2003-04-01 |
Machine vision and semiconductor handling App 20030039388 - Ulrich, Franz W. ;   et al. | 2003-02-27 |
Imaging system App 20020163573 - Bieman, Leonard H. ;   et al. | 2002-11-07 |
Detection assembly for detecting dispensed material App 20020113198 - Bieman, Leonard H. ;   et al. | 2002-08-22 |
3-D camera Grant 6,122,062 - Bieman , et al. September 19, 2 | 2000-09-19 |
Vision guided automatic robotic path teaching method Grant 5,959,425 - Bieman , et al. September 28, 1 | 1999-09-28 |
Method and system for measuring cavities and probe for use therein Grant 5,933,231 - Bieman , et al. August 3, 1 | 1999-08-03 |
Scanning phase measuring method and system for an object at a vision station Grant 5,646,733 - Bieman July 8, 1 | 1997-07-08 |
System for optically measuring the surface contour of a part using more fringe techniques Grant 5,636,025 - Bieman , et al. June 3, 1 | 1997-06-03 |
Method for spatial measurement of holes Grant 4,647,208 - Bieman March 3, 1 | 1987-03-03 |
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