Patent | Date |
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Methodology to prevent metal lines from current pulse damage Grant 10,216,870 - Bickford , et al. Feb | 2019-02-26 |
System and method for managing semiconductor manufacturing defects Grant 10,089,161 - Bickford , et al. October 2, 2 | 2018-10-02 |
System And Method For Managing Semiconductor Manufacturing Defects App 20180074874 - Bickford; Jeanne P. S. ;   et al. | 2018-03-15 |
System and method for managing semiconductor manufacturing defects Grant 9,880,892 - Bickford , et al. January 30, 2 | 2018-01-30 |
Methodology To Prevent Metal Lines From Current Pulse Damage App 20170199949 - BICKFORD; JEANNE P. S. ;   et al. | 2017-07-13 |
Determining intra-die variation of an integrated circuit Grant 9,255,962 - Bickford , et al. February 9, 2 | 2016-02-09 |
System And Method For Managing Semiconductor Manufacturing Defects App 20150241511 - Bickford; Jeanne P. S. ;   et al. | 2015-08-27 |
In-situ computing system failure avoidance Grant 9,058,250 - Bickford , et al. June 16, 2 | 2015-06-16 |
Controlling circuit voltage and frequency based upon location-dependent temperature Grant 8,963,620 - Bickford , et al. February 24, 2 | 2015-02-24 |
Determining Intra-die Variation Of An Integrated Circuit App 20150048860 - Bickford; Jeanne P.S. ;   et al. | 2015-02-19 |
In-situ Computing System Failure Avoidance App 20150033081 - Bickford; Jeanne P.S. ;   et al. | 2015-01-29 |
Method of managing electro migration in logic designs and design structure thereof Grant 8,938,701 - Barwin , et al. January 20, 2 | 2015-01-20 |
Yield optimization for design library elements at library element level or at product level Grant 8,799,836 - Bickford , et al. August 5, 2 | 2014-08-05 |
Terminal metal connection inspection Grant 8,694,936 - Bickford , et al. April 8, 2 | 2014-04-08 |
Via selection in integrated circuit design Grant 8,631,375 - Arelt , et al. January 14, 2 | 2014-01-14 |
Method of managing electro migration in logic designs and design structure thereof Grant 8,560,990 - Barwin , et al. October 15, 2 | 2013-10-15 |
Via Selection In Integrated Circuit Design App 20130268908 - Arelt; Robert R. ;   et al. | 2013-10-10 |
Method Of Managing Electro Migration In Logic Designs And Design Structure Thereof App 20110173583 - BARWIN; John E. ;   et al. | 2011-07-14 |
Integration of business process and use of fields in a master database Grant 7,386,549 - Bickford , et al. June 10, 2 | 2008-06-10 |
Relational database for producing bill-of-materials from planning information Grant 6,850,904 - Ballas , et al. February 1, 2 | 2005-02-01 |
Relational database for producing bill-of-materials from planning information Grant 6,819,967 - Ballas , et al. November 16, 2 | 2004-11-16 |
Integration of business process and use of fields in a master database App 20040220937 - Bickford, Jeanne P. S. ;   et al. | 2004-11-04 |
Relational database for producing bill-of-materials from planning information App 20040019538 - Ballas, Donald F. ;   et al. | 2004-01-29 |
Relational database for producing bill-of-materials from planning information App 20040019604 - Ballas, Donald F. ;   et al. | 2004-01-29 |