Bickford; Jeanne

Patent Applications and Registrations

Patent applications and USPTO patent grants for Bickford; Jeanne.The latest application filed is for "product performance test binning".

Company Profile

1.6.7

Bickford; Jeanne - Essex Junction VT

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Product performance test binning Grant 10,794,952 - Bickford , et al. October 6, 2	2020-10-06
Product Performance Test Binning App 20180292456 - Bickford; Jeanne ; et al.	2018-10-11
Product performance test binning Grant 10,067,184 - Anemikos , et al. September 4, 2	2018-09-04
Product Performance Test Binning App 20130124133 - Anemikos; Theodoros ; et al.	2013-05-16
Test yield estimate for semiconductor products created from a library Grant 8,010,916 - Bickford , et al. August 30, 2	2011-08-30
Method of optimizing power usage of an integrated circuit design by tuning selective voltage binning cut point Grant 7,810,054 - Anemikos , et al. October 5, 2	2010-10-05
Method To Optimize Power By Tuning The Selective Voltage Binning Cut Point App 20090228843 - Anemikos; Theodoros E. ; et al.	2009-09-10
Method For Generating Device Model Overrides Through The Use Of On-chip Parametric Measurement Macros App 20090070722 - Bickford; Jeanne ; et al.	2009-03-12
Test Yield Estimate For Semiconductor Products Created From A Library App 20080189664 - Bickford; Jeanne ; et al.	2008-08-07
Test yield estimate for semiconductor products created from a library Grant 7,386,815 - Bickford , et al. June 10, 2	2008-06-10
Test Yield Estimate For Semiconductor Products Created From A Library App 20070099236 - Bickford; Jeanne ; et al.	2007-05-03

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