| Patent | Date |
|---|
BBP assisted defect detection flow for SEM images
Grant 11,450,012 - Bhattacharyya , et al. September 20, 2 | 2022-09-20 |
Scanning Electron Microscope Image Anchoring to Design for Array
App 20220059316 - Bhattacharyya; Santosh ; et al. | 2022-02-24 |
System and method for difference filter and aperture selection using shallow deep learning
Grant 11,151,707 - Bhattacharyya , et al. October 19, 2 | 2021-10-19 |
Defect discovery and recipe optimization for inspection of three-dimensional semiconductor structures
Grant 11,047,806 - Bhattacharyya , et al. June 29, 2 | 2021-06-29 |
Defect-location determination using correction loop for pixel alignment
Grant 11,049,745 - Dowling , et al. June 29, 2 | 2021-06-29 |
BBP Assisted Defect Detection Flow for SEM Images
App 20210133989 - Bhattacharyya; Santosh ; et al. | 2021-05-06 |
And noise based care areas
Grant 10,832,396 - Duffy , et al. November 10, 2 | 2020-11-10 |
System and Method for Difference Filter and Aperture Selection Using Shallow Deep Learning
App 20200184628 - Bhattacharyya; Santosh ; et al. | 2020-06-11 |
Defect-Location Determination Using Correction Loop for Pixel Alignment
App 20200126830 - Dowling; David ; et al. | 2020-04-23 |
Design And Noise Based Care Areas
App 20200126212 - Duffy; Brian ; et al. | 2020-04-23 |
High sensitivity repeater defect detection
Grant 10,395,358 - Brauer , et al. A | 2019-08-27 |
System, method and computer program product for automatically generating a wafer image to design coordinate mapping
Grant 10,325,361 - Bhattacharyya | 2019-06-18 |
Combined patch and design-based defect detection
Grant 10,192,302 - Brauer , et al. Ja | 2019-01-29 |
Inspection for specimens with extensive die to die process variation
Grant 10,151,706 - Bhattacharyya , et al. Dec | 2018-12-11 |
Defect sensitivity of semiconductor wafer inspectors using design data with wafer image data
Grant 10,127,651 - Kulkarni , et al. November 13, 2 | 2018-11-13 |
Sub-pixel alignment of inspection to design
Grant 9,996,942 - Bhattacharyya , et al. June 12, 2 | 2018-06-12 |
Defect Discovery And Recipe Optimization For Inspection Of Three-Dimensional Semiconductor Structures
App 20180149603 - Bhattacharyya; Santosh ; et al. | 2018-05-31 |
High Sensitivity Repeater Defect Detection
App 20180130199 - Brauer; Bjorn ; et al. | 2018-05-10 |
Shape based grouping
Grant 9,965,848 - Banerjee , et al. May 8, 2 | 2018-05-08 |
System, Method And Computer Program Product For Automatically Generating A Wafer Image To Design Coordinate Mapping
App 20170352146 - Bhattacharyya; Santosh | 2017-12-07 |
Combined Patch And Design-based Defect Detection
App 20170345142 - Brauer; Bjorn ; et al. | 2017-11-30 |
Alignment of inspection to design using built in targets
Grant 9,830,421 - Bhattacharyya , et al. November 28, 2 | 2017-11-28 |
Defect Sensitivity Of Semiconductor Wafer Inspectors Using Design Data With Wafer Image Data
App 20170206650 - Kulkarni; Ashok ; et al. | 2017-07-20 |
Shape Based Grouping
App 20170186151 - Banerjee; Saibal ; et al. | 2017-06-29 |
Sub-Pixel Alignment of Inspection to Design
App 20160275672 - Bhattacharyya; Santosh ; et al. | 2016-09-22 |
Alignment of Inspection to Design Using Built in Targets
App 20160188784 - Bhattacharyya; Santosh ; et al. | 2016-06-30 |
Determining design coordinates for wafer defects
Grant 9,087,367 - Chang , et al. July 21, 2 | 2015-07-21 |
Determining Design Coordinates for Wafer Defects
App 20130064442 - Chang; Ellis ; et al. | 2013-03-14 |
Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer
Grant 8,204,296 - Bhaskar , et al. June 19, 2 | 2012-06-19 |
Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions
Grant 8,126,255 - Bhaskar , et al. February 28, 2 | 2012-02-28 |
Methods For Generating A Standard Reference Die For Use In A Die To Standard Reference Die Inspection And Methods For Inspecting A Wafer
App 20100329540 - Bhaskar; Kris ; et al. | 2010-12-30 |
Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer
Grant 7,796,804 - Bhaskar , et al. September 14, 2 | 2010-09-14 |
Systems and methods for detecting defects on a wafer and generating inspection results for the wafer
Grant 7,756,658 - Kulkarni , et al. July 13, 2 | 2010-07-13 |
Methods, defect review tools, and systems for locating a defect in a defect review process
Grant 7,747,062 - Chen , et al. June 29, 2 | 2010-06-29 |
Systems And Methods For Detecting Defects On A Wafer And Generating Inspection Results For The Wafer
App 20090287440 - Kulkarni; Ashok ; et al. | 2009-11-19 |
Systems And Methods For Creating Persistent Data For A Wafer And For Using Persistent Data For Inspection-related Functions
App 20090080759 - Bhaskar; Kris ; et al. | 2009-03-26 |
Methods For Generating A Standard Reference Die For Use In A Die To Standard Reference Die Inspection And Methods For Inspecting A Wafer
App 20090041332 - Bhaskar; Kris ; et al. | 2009-02-12 |
Methods, defect review tools, and systems for locating a defect in a defect review process
App 20080032429 - Chen; Da ; et al. | 2008-02-07 |
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