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Patent applications and USPTO patent grants for Bhaskarani; Sravan Kumar.The latest application filed is for "locally synchronous shared bist architecture for testing embedded memories with asynchronous interfaces".
Patent | Date |
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Integrated circuit die testing apparatus and methods Grant 8,400,181 - Bhaskarani March 19, 2 | 2013-03-19 |
Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces Grant 8,386,864 - Dubey , et al. February 26, 2 | 2013-02-26 |
Locally Synchronous Shared Bist Architecture For Testing Embedded Memories With Asynchronous Interfaces App 20120198291 - Dubey; Prashant ;   et al. | 2012-08-02 |
Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces Grant 8,108,744 - Dubey , et al. January 31, 2 | 2012-01-31 |
Integrated Circuit Die Testing Apparatus And Methods App 20110234253 - Bhaskarani; Sravan Kumar | 2011-09-29 |
Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces App 20080126892 - Dubey; Prashant ;   et al. | 2008-05-29 |
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