Bhaskar; Chetana

Patent Applications and Registrations

Patent applications and USPTO patent grants for Bhaskar; Chetana.The latest application filed is for "method and system for mixed mode wafer inspection".

Company Profile

2.6.6

Bhaskar; Chetana - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method And System For Mixed Mode Wafer Inspection App 20220230293 - Lin; Jason Z. ; et al.	2022-07-21
Method and system for mixed mode wafer inspection Grant 11,295,438 - Lin , et al. April 5, 2	2022-04-05
High sensitivity repeater defect detection Grant 10,395,358 - Brauer , et al. A	2019-08-27
Method and System for Mixed Mode Wafer Inspection App 20190108630 - Lin; Jason Z. ; et al.	2019-04-11
Method and system for mixed mode wafer inspection Grant 10,192,303 - Lin , et al. Ja	2019-01-29
High Sensitivity Repeater Defect Detection App 20180130199 - Brauer; Bjorn ; et al.	2018-05-10
Inspection recipe setup from reference image variation Grant 9,262,821 - Shifrin , et al. February 16, 2	2016-02-16
Inspection Recipe Setup from Reference Image Variation App 20150324964 - Shifrin; Eugene ; et al.	2015-11-12
Method and System for Mixed Mode Wafer Inspection App 20140153814 - Lin; Jason Z. ; et al.	2014-06-05
Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions Grant 8,126,255 - Bhaskar , et al. February 28, 2	2012-02-28
Systems And Methods For Creating Persistent Data For A Wafer And For Using Persistent Data For Inspection-related Functions App 20090080759 - Bhaskar; Kris ; et al.	2009-03-26
Electron beam inspection system and method Grant 5,502,306 - Meisburger , et al. March 26, 1	1996-03-26

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