Bertsche; Kirk J.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Bertsche; Kirk J..The latest application filed is for "inline inspection of photovoltaics for electrical defects".
- Bertsche; Kirk J. - San Jose CA
| Patent | Date |
|---|---|
| Inline inspection of photovoltaics for electrical defects Grant 8,427,185 - Zapalac, Jr. , et al. April 23, 2 | 2013-04-23 |
| Inline Inspection Of Photovoltaics For Electrical Defects App 20110133750 - Zapalac, JR.; George H. ; et al. | 2011-06-09 |
| Inline inspection of photovoltaics for electrical defects Grant 7,906,972 - Zapalac, Jr. , et al. March 15, 2 | 2011-03-15 |
| Inline Inspection Of Photovoltaics For Electrical Defects App 20100079147 - Zapalac, Jr.; George H. ; et al. | 2010-04-01 |
| Inline inspection of photovoltaics for electrical defects Grant 7,649,365 - Zapalac, Jr. , et al. January 19, 2 | 2010-01-19 |
| Method for charging substrate to a potential Grant 7,507,959 - Bertsche , et al. March 24, 2 | 2009-03-24 |
| Electronically-variable immersion electrostatic lens Grant 7,446,320 - McCord , et al. November 4, 2 | 2008-11-04 |
| Large-field scanning of charged particles Grant 7,394,069 - Bertsche July 1, 2 | 2008-07-01 |
| Electron imaging beam with reduced space charge defocusing Grant 7,391,034 - Bertsche , et al. June 24, 2 | 2008-06-24 |
| High-speed electron beam inspection Grant 7,315,022 - Adler , et al. January 1, 2 | 2008-01-01 |
| Defect detection using energy spectrometer Grant 7,276,694 - Bertsche October 2, 2 | 2007-10-02 |
| Charge-control pre-scanning for e-beam imaging Grant 7,253,410 - Bertsche , et al. August 7, 2 | 2007-08-07 |
| Method for charging substrate to a potential App 20070158589 - Bertsche; Kirk J. ; et al. | 2007-07-12 |
| Method for charging substrate to a potential Grant 7,176,468 - Bertsche , et al. February 13, 2 | 2007-02-13 |
| E-beam detection of defective contacts/vias with flooding and energy filter Grant 7,019,292 - Fan , et al. March 28, 2 | 2006-03-28 |
| Method for charging substrate to a potential App 20060054815 - Bertsche; Kirk J. ; et al. | 2006-03-16 |
| Maskless reflection electron beam projection lithography Grant 6,870,172 - Mankos , et al. March 22, 2 | 2005-03-22 |
| Ribbon electron beam for inspection system Grant 6,822,246 - Bertsche November 23, 2 | 2004-11-23 |
| Ribbon electron beam for inspection system App 20030183763 - Bertsche, Kirk J. | 2003-10-02 |
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