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Berrian; Donald W. Patent Filings

Berrian; Donald W.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Berrian; Donald W..The latest application filed is for "ion beam profiler".

Company Profile
0.19.16
  • Berrian; Donald W. - Topsfield MA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Particulate prevention in ion implantation
Grant 7,547,898 - Berrian , et al. June 16, 2
2009-06-16
Ion beam profiler
Grant 7,381,977 - Pollock , et al. June 3, 2
2008-06-03
Reciprocating drive for scanning a workpiece
Grant 7,323,695 - Vanderpot , et al. January 29, 2
2008-01-29
System and method for rapidly controlling the output of an ion source for ion implantation
Grant 7,247,863 - Berrian July 24, 2
2007-07-24
Ion beam profiler
App 20070069156 - Pollock; John D. ;   et al.
2007-03-29
Particulate prevention in ion implantation
App 20060284116 - Berrian; Donald W. ;   et al.
2006-12-21
Method for reciprocating a workpiece through an ion beam
Grant 7,141,809 - Vanderpot , et al. November 28, 2
2006-11-28
Reciprocating drive for scanning a workpiece through an ion beam
Grant 7,135,691 - Vanderpot , et al. November 14, 2
2006-11-14
Method for reciprocating a workpiece through an ion beam
App 20050232749 - Vanderpot, John W. ;   et al.
2005-10-20
Reciprocating drive for scanning a workpiece
App 20050232748 - Vanderpot, John W. ;   et al.
2005-10-20
Reciprocating drive for scanning a workpiece through an ion beam
App 20050230643 - Vanderpot, John W. ;   et al.
2005-10-20
Substrate positioning system
Grant 6,921,907 - Vanderpot , et al. July 26, 2
2005-07-26
System and method for implanting a wafer with an ion beam
Grant 6,833,552 - Berrian December 21, 2
2004-12-21
Substrate positioning system
App 20040245480 - Vanderpot, John W. ;   et al.
2004-12-09
Substrate positioning system
Grant 6,777,687 - Vanderpot , et al. August 17, 2
2004-08-17
Hybrid scanning system and methods for ion implantation
Grant 6,765,219 - Berrian , et al. July 20, 2
2004-07-20
System and method for implanting a wafer with an ion beam
App 20040084636 - Berrian, Donald W.
2004-05-06
System and method for uniformly implanting a wafer with an ion beam
Grant 6,677,599 - Berrian January 13, 2
2004-01-13
Ion implantation uniformity correction using beam current control
Grant 6,661,016 - Berrian December 9, 2
2003-12-09
High efficiency scanning in ion implanters
Grant 6,580,083 - Berrian June 17, 2
2003-06-17
System and method for amplifying an angle of divergence of a scanned ion beam
App 20030001110 - Enge, Harald ;   et al.
2003-01-02
Substrate positioning system
App 20020134950 - Vanderpot, John W. ;   et al.
2002-09-26
Substrate positioning system
App 20020125446 - Vanderpot, John W. ;   et al.
2002-09-12
Hybrid scanning system and methods for ion implantation
App 20020109106 - Berrian, Donald W. ;   et al.
2002-08-15
System and method for rapidly controlling the output of an ion source for ion implantation
App 20020053642 - Berrian, Donald W.
2002-05-09
Magnetic scanning system with a nonzero field
App 20020050569 - Berrian, Donald W.
2002-05-02
High efficiency scanning in ion implanters
App 20020003215 - Berrian, Donald W.
2002-01-10
Ion implantation uniformity correction using beam current control
App 20010054698 - Berrian, Donald W.
2001-12-27
System and method for uniformity enhancement during ion implantation
App 20010032937 - Berrian, Donald W.
2001-10-25
Disposable electronic monitor device
Grant RE36,200 - Berrian , et al. April 27, 1
1999-04-27
Methods and apparatus for measuring temperatures at high potential
Grant 5,806,980 - Berrian September 15, 1
1998-09-15
Disposable electronic monitor device
Grant 5,313,848 - Santin , et al. May 24, 1
1994-05-24
Method and apparatus for high efficiency scanning in an ion implanter
Grant 4,980,562 - Berrian , et al. December 25, 1
1990-12-25
Ion beam scanning method and apparatus
Grant 4,922,106 - Berrian , et al. May 1, 1
1990-05-01
Pattern data handling system for an electron beam exposure system
Grant 4,433,384 - Berrian , et al. February 21, 1
1984-02-21

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