Benner; Gerd

Patent Applications and Registrations

Patent applications and USPTO patent grants for Benner; Gerd.The latest application filed is for "particle beam system and method for operating a particle optical unit".

Company Profile

2.29.23

Benner; Gerd - Aalen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Particle beam system and method for operating a particle optical unit Grant 9,991,089 - Mueller , et al. June 5, 2	2018-06-05
Particle Beam System And Method For Operating A Particle Optical Unit App 20180040454 - Mueller; Ingo ; et al.	2018-02-08
Particle beam system and method for operating a particle optical unit Grant 9,799,485 - Mueller , et al. October 24, 2	2017-10-24
Electron microscope Grant 9,543,115 - Benner , et al. January 10, 2	2017-01-10
Particle optical system Grant 9,349,571 - Kemen , et al. May 24, 2	2016-05-24
Particle Beam System And Method For Operating A Particle Optical Unit App 20150357157 - Mueller; Ingo ; et al.	2015-12-10
Electron Microscope App 20150144787 - Benner; Gerd ; et al.	2015-05-28
Particle Optical System App 20150069235 - Kemen; Thomas ; et al.	2015-03-12
Transmission electron microscopy system and method of operating a transmission electron microscopy system Grant 8,748,819 - Benner June 10, 2	2014-06-10
Transmission electron microscope Grant 8,598,526 - Benner December 3, 2	2013-12-03
Transmission Electron Microscopy System and Method of Operating a Transmission Electron Microscopy System App 20130292566 - Benner; Gerd	2013-11-07
Apparatus For Contaminants Being Deposited Thereon App 20130256558 - DIETL; Christian ; et al.	2013-10-03
Precession diffraction charged particle beam system Grant 8,541,739 - Benner , et al. September 24, 2	2013-09-24
Particle beam microscope Grant 8,476,589 - Benner , et al. July 2, 2	2013-07-02
Particle-beam microscope Grant 8,471,203 - Benner , et al. June 25, 2	2013-06-25
Phase-shifting element and particle beam device having a phase-shifting element Grant 8,436,302 - Schroder , et al. May 7, 2	2013-05-07
Electron beam device Grant 8,431,894 - Essers , et al. April 30, 2	2013-04-30
Phase-shifting Element And Particle Beam Device Having A Phase-shifting Element App 20130001445 - SCHRODER; Rasmus ; et al.	2013-01-03
Particle Beam Microscope App 20120326030 - Benner; Gerd ; et al.	2012-12-27
Particle Beam Microscope App 20120326032 - Benner; Gerd ; et al.	2012-12-27
Phase contrast electron microscope Grant 8,330,105 - Benner , et al. December 11, 2	2012-12-11
Particle beam apparatus having an annularly-shaped illumination aperture Grant 8,299,442 - Benner October 30, 2	2012-10-30
Phase-shifting element and particle beam device having a phase-shifting element Grant 8,173,963 - Schroder , et al. May 8, 2	2012-05-08
Phase Contrast Electron Microscope App 20120049062 - Benner; Gerd ; et al.	2012-03-01
Charged Particle Beam System App 20120025094 - Benner; Gerd ; et al.	2012-02-02
Phase contrast electron microscope Grant 8,039,796 - Benner , et al. October 18, 2	2011-10-18
Phase-shifting element and particle beam device having a phase-shifting element App 20110233402 - Schroder; Rasmus ; et al.	2011-09-29
Transmission Electron Microscope App 20110210249 - Benner; Gerd	2011-09-01
Phase-shifting element and particle beam device having a phase-shifting element Grant 7,902,506 - Schroder , et al. March 8, 2	2011-03-08
Particle-beam Microscope App 20100258719 - Benner; Gerd ; et al.	2010-10-14
Phase contrast electron microscope App 20100181481 - Benner; Gerd ; et al.	2010-07-22
Phase contrast electron microscope Grant 7,741,602 - Benner , et al. June 22, 2	2010-06-22
Particle beam apparatus having an annularly-shaped illumination aperture App 20100038537 - Benner; Gerd	2010-02-18
Electron beam device App 20090039257 - Essers; Erik ; et al.	2009-02-12
Phase-shifting element and particle beam device having a phase-shifting element App 20080296509 - Schroder; Rasmus ; et al.	2008-12-04
Phase contrast electron microscope App 20070284528 - Benner; Gerd ; et al.	2007-12-13
Detector system for a particle beam apparatus, and particle beam apparatus with such a detector system Grant 7,060,978 - Drexel , et al. June 13, 2	2006-06-13
Electron microscope with annular illuminating aperture Grant 6,797,956 - Benner September 28, 2	2004-09-28
Process for electron beam lithography, and electron-optical lithography system Grant 6,657,211 - Benner December 2, 2	2003-12-02
Electron microscope with annular illuminating aperture App 20030132383 - Benner, Gerd	2003-07-17
Process for electron beam lithography, and electron-optical lithography system App 20020043629 - Benner, Gerd	2002-04-18
Detector system for a particle beam apparatus, and particle beam apparatus with such a detector system App 20020011565 - Drexel, Volker ; et al.	2002-01-31
Energy filter, particularly for an electron microscope Grant 6,040,576 - Benner March 21, 2	2000-03-21
Method of illuminating an object with a focused electron beam and an electron-optical illuminating system therefor Grant 5,483,073 - Benner January 9, 1	1996-01-09
Method of illuminating an object in a transmission electron microscope Grant 5,013,913 - Benner May 7, 1	1991-05-07

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