loadpatents
name:-0.012732982635498
name:-0.0035741329193115
name:-0.0099020004272461
Benjamin Raj; Daemian Raj Patent Filings

Benjamin Raj; Daemian Raj

Patent Applications and Registrations

Patent applications and USPTO patent grants for Benjamin Raj; Daemian Raj.The latest application filed is for "method of reducing defects in a multi-layer pecvd teos oxide film".

Company Profile
9.2.11
  • Benjamin Raj; Daemian Raj - Fremont CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Film stack overlay improvement
Grant 11,339,475 - Han , et al. May 24, 2
2022-05-24
Method Of Reducing Defects In A Multi-layer Pecvd Teos Oxide Film
App 20220119952 - Howlader; Rana ;   et al.
2022-04-21
Power Supply Signal Conditioning For An Electrostatic Chuck
App 20220102179 - Ye; Zheng John ;   et al.
2022-03-31
Switchable Delivery For Semiconductor Processing System
App 20220020570 - Addepalli; Sai Susmita ;   et al.
2022-01-20
Method of forming film stacks with reduced defects
Grant 11,145,504 - Jiang , et al. October 12, 2
2021-10-12
Methods and Apparatus for Controlling RF Parameters at Multiple Frequencies
App 20210059037 - Ye; Zheng John ;   et al.
2021-02-25
Chamber Configurations For Controlled Deposition
App 20210047730 - Addepalli; Sai Susmita ;   et al.
2021-02-18
Semiconductor Substrate Supports With Improved High Temperature Chucking
App 20210035843 - Li; Jian ;   et al.
2021-02-04
Thermally Stable Flow Meters For Precision Fluid Delivery
App 20210003340 - SRIVASTAVA; Shailendra ;   et al.
2021-01-07
Faceplate Having A Curved Surface
App 20200385862 - SRIVASTAVA; Shailendra ;   et al.
2020-12-10
Dynamic Multi Zone Flow Control For A Processing System
App 20200365386 - BENJAMIN RAJ; Daemian Raj ;   et al.
2020-11-19
Method Of Forming Film Stacks With Reduced Defects
App 20200227258 - JIANG; Zhijun ;   et al.
2020-07-16
Film Stack Overlay Improvement For 3d Nand Application
App 20200173022 - HAN; Xinhai ;   et al.
2020-06-04

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