BENAYAD-CHERIF; Faycal

Patent Applications and Registrations

Patent applications and USPTO patent grants for BENAYAD-CHERIF; Faycal.The latest application filed is for "laser marking through the lens of an image scanning system".

Company Profile

5.5.8

BENAYAD-CHERIF; Faycal - Selmsdorf DE
Benayad-Cherif; Faycal - Lexington MA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Laser Marking Through The Lens Of An Image Scanning System App 20200338919 - Benayad-Cherif; Faycal ; et al.	2020-10-29
Laser marking through the lens of an image scanning system with multiple location image calibration Grant 10,752,017 - Benayad-Cherif , et al. A	2020-08-25
Laser Marking Through The Lens Of An Image Scanning System With Multiple Location Image Calibration App 20200139725 - Benayad-Cherif; Faycal ; et al.	2020-05-07
Laser Marking System With Through-the-lens Autofocus App 20190151992 - BAHNS; Christopher ; et al.	2019-05-23
Method of measuring the outline of a feature Grant 8,934,668 - Benayad-Cherif January 13, 2	2015-01-13
Method Of Measuring The Outline Of A Feature App 20120170813 - Benayad-Cherif; Faycal	2012-07-05
Laser Parameter Adjustment App 20110293907 - Benayad-Cherif; Faycal	2011-12-01
Multi model registration (MMR) for a galvanometer and laser system Grant 8,000,831 - Benayad-Cherif August 16, 2	2011-08-16
Multi Model Registration (mmr) For A Galvanometer And Laser System App 20100017012 - BENAYAD-CHERIF; Faycal	2010-01-21
Non-contact measurement method and apparatus Grant 7,327,857 - Lloyd, Jr. , et al. February 5, 2	2008-02-05
Non-contact measurement method and apparatus App 20050201611 - Lloyd, Thomas Watkins JR. ; et al.	2005-09-15

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