loadpatents
name:-0.0071079730987549
name:-0.0061838626861572
name:-0.0040609836578369
Ben Dov; Guy Patent Filings

Ben Dov; Guy

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ben Dov; Guy.The latest application filed is for "field-to-field corrections using overlay targets".

Company Profile
3.4.5
  • Ben Dov; Guy - Haifa IL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Field-to-field Corrections Using Overlay Targets
App 20210200105 - Leshinsky-Altshuller; Enna ;   et al.
2021-07-01
Field-to-field corrections using overlay targets
Grant 10,990,022 - Leshinsky-Altshuller , et al. April 27, 2
2021-04-27
Field-to-Field Corrections Using Overlay Targets
App 20200201193 - Leshinsky-Altshuller; Enna ;   et al.
2020-06-25
Symmetric target design in scatterometry overlay metrology
Grant 10,591,406 - Bringoltz , et al.
2020-03-17
Pupil plane calibration for scatterometry overlay measurement
Grant 9,909,982 - Bringoltz , et al. March 6, 2
2018-03-06
Symmetric target design in scatterometry overlay metrology
Grant 9,739,702 - Bringoltz , et al. August 22, 2
2017-08-22
Symmetric Target Design In Scatterometry Overlay Metrology
App 20160216197 - Bringoltz; Barak ;   et al.
2016-07-28
Symmetric Target Design In Scatterometry Overlay Metrology
App 20150204664 - Bringoltz; Barak ;   et al.
2015-07-23
Pupil Plane Calibration For Scatterometry Overlay Measurement
App 20140257734 - Bringoltz; Barak ;   et al.
2014-09-11

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