Beltman; Johannes Marcus Maria
Patent Applications and Registrations
Patent applications and USPTO patent grants for Beltman; Johannes Marcus Maria.The latest application filed is for "metrology method, target and substrate".
- Beltman; Johannes Marcus Maria - Knegsel NL
| Patent | Date |
|---|---|
| Metrology method, target and substrate Grant 11,428,521 - Bhattacharyya , et al. August 30, 2 | 2022-08-30 |
| Metrology Method, Target And Substrate App 20220057192 - BHATTACHARYYA; Kaustuve ; et al. | 2022-02-24 |
| Metrology method, target and substrate Grant 11,204,239 - Bhattacharyya , et al. December 21, 2 | 2021-12-21 |
| Metrology Method, Target And Substrate App 20200348125 - BHATTACHARYYA; Kaustuve ; et al. | 2020-11-05 |
| Method and apparatus for reticle optimization Grant 10,725,372 - Tel , et al. | 2020-07-28 |
| Metrology method, target and substrate Grant 10,718,604 - Bhattacharyya , et al. | 2020-07-21 |
| Metrology Method, Target And Substrate App 20190346256 - BHATTACHARYYA; Kaustuve ; et al. | 2019-11-14 |
| Metrology method, target and substrate Grant 10,386,176 - Bhattacharyya , et al. A | 2019-08-20 |
| Optimization of target arrangement and associated target Grant 10,331,043 - Van Buel , et al. | 2019-06-25 |
| Method And Apparatus For Reticle Optimization App 20180011398 - TEL; Wim Tjibbo ; et al. | 2018-01-11 |
| Optimization Of Target Arrangement And Associated Target App 20170176871 - VAN BUEL; Henricus Wilhelmus Maria ; et al. | 2017-06-22 |
| Metrology Method, Target And Substrate App 20160061589 - BHATTACHARYYA; Kaustuve ; et al. | 2016-03-03 |
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