loadpatents
Patent applications and USPTO patent grants for Beltman; Johannes Marcus Maria.The latest application filed is for "metrology method, target and substrate".
Patent | Date |
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Metrology method, target and substrate Grant 11,428,521 - Bhattacharyya , et al. August 30, 2 | 2022-08-30 |
Metrology Method, Target And Substrate App 20220057192 - BHATTACHARYYA; Kaustuve ;   et al. | 2022-02-24 |
Metrology method, target and substrate Grant 11,204,239 - Bhattacharyya , et al. December 21, 2 | 2021-12-21 |
Metrology Method, Target And Substrate App 20200348125 - BHATTACHARYYA; Kaustuve ;   et al. | 2020-11-05 |
Method and apparatus for reticle optimization Grant 10,725,372 - Tel , et al. | 2020-07-28 |
Metrology method, target and substrate Grant 10,718,604 - Bhattacharyya , et al. | 2020-07-21 |
Metrology Method, Target And Substrate App 20190346256 - BHATTACHARYYA; Kaustuve ;   et al. | 2019-11-14 |
Metrology method, target and substrate Grant 10,386,176 - Bhattacharyya , et al. A | 2019-08-20 |
Optimization of target arrangement and associated target Grant 10,331,043 - Van Buel , et al. | 2019-06-25 |
Method And Apparatus For Reticle Optimization App 20180011398 - TEL; Wim Tjibbo ;   et al. | 2018-01-11 |
Optimization Of Target Arrangement And Associated Target App 20170176871 - VAN BUEL; Henricus Wilhelmus Maria ;   et al. | 2017-06-22 |
Metrology Method, Target And Substrate App 20160061589 - BHATTACHARYYA; Kaustuve ;   et al. | 2016-03-03 |
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