Bean; Stewart

Patent Applications and Registrations

Patent applications and USPTO patent grants for Bean; Stewart.The latest application filed is for "charged particle optical apparatus for through-the-lens detection of particles".

Company Profile

2.9.8

Bean; Stewart - Cambridgeshire GB
Bean; Stewart - Wyton GB

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged particle optical apparatus for through-the-lens detection of particles Grant 11,276,547 - Essers , et al. March 15, 2	2022-03-15
Charged Particle Optical Apparatus For Through-the-lens Detection Of Particles App 20210050178 - Essers; Erik ; et al.	2021-02-18
Charged particle optical apparatus for through-the-lens detection of particles Grant 10,861,670 - Essers , et al. December 8, 2	2020-12-08
Charged Particle Optical Apparatus For Through-the-lens Detection Of Particles App 20200135425 - Essers; Erik ; et al.	2020-04-30
Charged particle optical apparatus for through-the-lens detection of particles Grant 10,522,321 - Essers , et al. Dec	2019-12-31
Charged Particle Optical Apparatus For Through-the-lens Detection Of Particles App 20180342368 - Essers; Erik ; et al.	2018-11-29
Charged particle optical apparatus for through-the lens detection of particles Grant 10,068,744 - Essers , et al. September 4, 2	2018-09-04
Charged particle optical apparatus having a selectively positionable differential pressure module Grant 9,741,528 - Albiez , et al. August 22, 2	2017-08-22
Charged Particle Optical Apparatus For Through-the Lens Detection Of Particles App 20170154752 - Essers; Erik ; et al.	2017-06-01
Charged Particle Optical Apparatus Having A Selectively Positionable Differential Pressure Module App 20150348742 - Albiez; Michael ; et al.	2015-12-03
Method of analyzing a sample and charged particle beam device for analyzing a sample Grant 9,159,532 - Hill , et al. October 13, 2	2015-10-13
Method Of Analyzing A Sample And Charged Particle Beam Device For Analyzing A Sample App 20140197310 - Hill; Edward ; et al.	2014-07-17
Particle beam system having a hollow light guide Grant 8,648,301 - Bean , et al. February 11, 2	2014-02-11
Microscope system, method for operating a charged-particle microscope Grant 8,426,812 - Bean , et al. April 23, 2	2013-04-23
Particle Beam System Having A Hollow Light Guide App 20130075604 - Bean; Stewart ; et al.	2013-03-28
Microscope System, Method for Operating a Charged-Particle Microscope App 20120104250 - Bean; Stewart ; et al.	2012-05-03

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.