loadpatents
name:-0.0090451240539551
name:-0.013767957687378
name:-0.00154709815979
Baur; Ulrich Patent Filings

Baur; Ulrich

Patent Applications and Registrations

Patent applications and USPTO patent grants for Baur; Ulrich.The latest application filed is for "integrated circuit arrangement for test inputs".

Company Profile
1.13.5
  • Baur; Ulrich - Boeblingen DE
  • Baur; Ulrich - Stuttgart DE
  • Baur; Ulrich - Weil In Schoenbuch DE
  • Baur; Ulrich - Weil im Schoenbuch DE
  • Baur; Ulrich - Hirschberg-Leutershausen DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Integrated circuit arrangement for test inputs
Grant 8,479,070 - Baur , et al. July 2, 2
2013-07-02
Integrated Circuit Arrangement For Test Inputs
App 20110320898 - Baur; Ulrich ;   et al.
2011-12-29
Vehicle, toy replica and/or other replicas
Grant D635,893 - Baur , et al. April 12, 2
2011-04-12
Front end of a vehicle, toy replica and/or other replicas
Grant D635,898 - Baur , et al. April 12, 2
2011-04-12
Foot for a side mirror for a vehicle
Grant D617,704 - Bauer , et al. June 15, 2
2010-06-15
Side mirror for a vehicle
Grant D616,344 - Bauer , et al. May 25, 2
2010-05-25
Side mirror for a vehicle
Grant D616,345 - Bauer , et al. May 25, 2
2010-05-25
VLSI chip test power reduction
Grant 6,816,990 - Song , et al. November 9, 2
2004-11-09
Self-test for leakage current of driver/receiver stages
Grant 6,774,656 - Baur , et al. August 10, 2
2004-08-10
Random path delay testing methodology
Grant 6,728,914 - McCauley , et al. April 27, 2
2004-04-27
Self-test with split, asymmetric controlled driver output stage
Grant 6,725,171 - Baur , et al. April 20, 2
2004-04-20
Global transition scan based AC method
Grant 6,662,324 - Motika , et al. December 9, 2
2003-12-09
VLSI chip test power reduction
App 20030145263 - Song, Peilin ;   et al.
2003-07-31
Random path delay testing methodology
App 20020083386 - McCauley, Kevin William ;   et al.
2002-06-27
Self-test for leakage current of driver/receiver stages
App 20020079915 - Baur, Ulrich ;   et al.
2002-06-27
Self-test with split, asymmetric controlled driver output stage
App 20020078400 - Baur, Ulrich ;   et al.
2002-06-20
Pressure sensor with pivoting lever
Grant 6,016,705 - Baur , et al. January 25, 2
2000-01-25

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