Baur; Christof

Patent Applications and Registrations

Patent applications and USPTO patent grants for Baur; Christof.The latest application filed is for "method, device and computer program for repairing a mask defect".

Company Profile

10.23.32

Baur; Christof - Darmstadt DE
Baur; Christof - Germany DE
Baur; Christof - Dallas TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method, Device And Computer Program For Repairing A Mask Defect App 20220308443 - Schoneberg; Johannes ; et al.	2022-09-29
Method And Apparatuses For Disposing Of Excess Material Of A Photolithographic Mask App 20220299864 - Budach; Michael ; et al.	2022-09-22
Methods And Devices For Extending A Time Period Until Changing A Measuring Tip Of A Scanning Probe Microscope App 20220291255 - Baralia; Gabriel ; et al.	2022-09-15
Method and apparatus for removing a particle from a photolithographic mask Grant 11,429,020 - Baur , et al. August 30, 2	2022-08-30
Apparatus And Method For Examining And/or Processing A Sample App 20220178965 - Baur; Christof ; et al.	2022-06-09
Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope Grant 11,353,478 - Baralia , et al. June 7, 2	2022-06-07
Apparatus And Method For A Scanning Probe Microscope App 20220146548 - Matejka; Ulrich ; et al.	2022-05-12
Method And Apparatus For Examining A Measuring Tip Of A Scanning Probe Microscope App 20220107340 - Kornilov; Kinga ; et al.	2022-04-07
Device And Method For Operating A Bending Beam In A Closed Control Loop App 20220082583 - Baur; Christof ; et al.	2022-03-17
Apparatus and method for examining and/or processing a sample Grant 11,262,378 - Baur , et al. March 1, 2	2022-03-01
Method and apparatus for examining a measuring tip of a scanning probe microscope Grant 11,237,187 - Kornilov , et al. February 1, 2	2022-02-01
Apparatus and method for a scanning probe microscope Grant 11,237,185 - Matejka , et al. February 1, 2	2022-02-01
Apparatus And Method For Removing A Single Particulate From A Substrate App 20220011682 - Edinger; Klaus ; et al.	2022-01-13
Device And Method For Analysing A Defect Of A Photolithographic Mask Or Of A Wafer App 20210247336 - Baralia; Gabriel ; et al.	2021-08-12
Scanning probe microscope and method for increasing a scan speed of a scanning probe microscope in the step-in scan mode Grant 11,054,439 - Baur July 6, 2	2021-07-06
Device and method for analysing a defect of a photolithographic mask or of a wafer Grant 10,983,075 - Baralia , et al. April 20, 2	2021-04-20
Apparatus And Method For Examining And/or Processing A Sample App 20210109126 - Baur; Christof ; et al.	2021-04-15
Method And Apparatus For Removing A Particle From A Photolithographic Mask App 20210048744 - Baur; Christof ; et al.	2021-02-18
Method And Apparatus For Examining A Measuring Tip Of A Scanning Probe Microscope App 20200141972 - Kornilov; Kinga ; et al.	2020-05-07
Method And Apparatuses For Disposing Of Excess Material Of A Photolithographic Mask App 20200103751 - Budach; Michael ; et al.	2020-04-02
Probe system and method for receiving a probe of a scanning probe microscope Grant 10,578,644 - Baur , et al.	2020-03-03
Apparatus And Method For A Scanning Probe Microscope App 20200025796 - Matejka; Ulrich ; et al.	2020-01-23
Methods And Devices For Extending A Time Period Until Changing A Measuring Tip Of A Scanning Probe Microscope App 20190317126 - Baralia; Gabriel ; et al.	2019-10-17
Beam blanker and method for blanking a charged particle beam Grant 10,410,820 - Budach , et al. Sept	2019-09-10
Scanning Probe Microscope And Method For Increasing A Scan Speed Of A Scanning Probe Microscope In The Step-in Scan Mode App 20190250185 - Baur; Christof	2019-08-15
Scanning probe microscope and method for examining a surface with a high aspect ratio Grant 10,119,990 - Baur , et al. November 6, 2	2018-11-06
Method and apparatus for avoiding damage when analysing a sample surface with a scanning probe microscope Grant 9,995,764 - Pieper , et al. June 12, 2	2018-06-12
Beam Blanker And Method For Blanking A Charged Particle Beam App 20180151327 - Budach; Michael ; et al.	2018-05-31
Probe System And Method For Receiving A Probe Of A Scanning Probe Microscope App 20180095108 - Baur; Christof ; et al.	2018-04-05
Device And Method For Analysing A Defect Of A Photolithographic Mask Or Of A Wafer App 20170292923 - Baralia; Gabriel ; et al.	2017-10-12
Method And Apparatus For Avoiding Damage When Analysing A Sample Surface With A Scanning Probe Microscope App 20170261532 - Pieper; Hans Hermann ; et al.	2017-09-14
Scanning Probe Microscope And Method For Examining A Surface With A High Aspect Ratio App 20170102407 - Baur; Christof ; et al.	2017-04-13
Scanning particle microscope and method for determining a position change of a particle beam of the scanning particle microscope Grant 9,336,983 - Budach , et al. May 10, 2	2016-05-10
Scanning Particle Microscope And Method For Determining A Position Change Of A Particle Beam Of The Scanning Particle Microscope App 20150380210 - Budach; Michael ; et al.	2015-12-31
Apparatus and method for investigating an object Grant 9,115,981 - Baur , et al. August 25, 2	2015-08-25
Apparatus and method for analyzing and modifying a specimen surface Grant 8,769,709 - Baur , et al. July 1, 2	2014-07-01
Apparatus And Method For Investigating An Object App 20140027512 - Baur; Christof ; et al.	2014-01-30
Apparatus And Method For Analyzing And Modifying A Specimen Surface App 20140007306 - Baur; Christof ; et al.	2014-01-02
Patterned atomic layer epitaxy Grant 7,799,132 - Randall , et al. September 21, 2	2010-09-21
Charged particle beam device probe operation Grant 7,675,300 - Baur , et al. March 9, 2	2010-03-09
Charged Particle Beam Device Probe Operation App 20080150557 - BAUR; Christof ; et al.	2008-06-26
Patterned Atomic Layer Epitaxy App 20080092803 - Randall; John N. ; et al.	2008-04-24
Patterned atomic layer epitaxy Grant 7,326,293 - Randall , et al. February 5, 2	2008-02-05
Charged particle beam device probe operation Grant 7,319,336 - Baur , et al. January 15, 2	2008-01-15
Probe current imaging Grant 7,285,778 - Baur , et al. October 23, 2	2007-10-23
Positioning device for microscopic motion Grant 7,196,454 - Baur , et al. March 27, 2	2007-03-27
Charged particle beam device probe operation App 20060192116 - Baur; Christof ; et al.	2006-08-31
Systems and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forces Grant 6,987,277 - Baur , et al. January 17, 2	2006-01-17
Patterned atomic layer epitaxy App 20050223968 - Randall, John N. ; et al.	2005-10-13
Probe tip processing App 20050184028 - Baur, Christof ; et al.	2005-08-25
Probe current imaging App 20050184236 - Baur, Christof ; et al.	2005-08-25
Positioning device for microscopic motion App 20050184623 - Baur, Christof ; et al.	2005-08-25
System and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forces App 20050077468 - Baur, Christof ; et al.	2005-04-14
Nano-manipulation by gyration Grant 6,812,460 - Stallcup, II , et al. November 2, 2	2004-11-02
System and method for accurate positioning of a scanning probe microscope Grant 6,608,307 - Baur August 19, 2	2003-08-19

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