Batchelder; John S.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Batchelder; John S..The latest application filed is for "volumetric feed control for flexible filament".

Company Profile

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Batchelder; John S. - Somers NY
Batchelder; John S. - Tarrytown NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Volumetric feed control for flexible filament Grant 6,085,957 - Zinniel , et al. July 11, 2	2000-07-11
Method for controlled porosity three-dimensional modeling Grant 5,653,925 - Batchelder August 5, 1	1997-08-05
Method for optimizing parameters characteristic of an object developed in a rapid prototyping system Grant 5,491,643 - Batchelder February 13, 1	1996-02-13
Method for optimizing the motion of a multi-axis robot Grant 5,426,722 - Batchelder June 20, 1	1995-06-20
Model generation system having closed-loop extrusion nozzle positioning Grant 5,402,351 - Batchelder , et al. March 28, 1	1995-03-28
Surface particle detection using heterodyne interferometer Grant 5,343,290 - Batchelder , et al. August 30, 1	1994-08-30
Generation of ionized air for semiconductor chips Grant 5,316,970 - Batchelder , et al. May 31, 1	1994-05-31
Conical logarithmic spiral viscosity pump Grant 5,312,224 - Batchelder , et al. May 17, 1	1994-05-17
Model generation system having closed-loop extrusion nozzle positioning Grant 5,303,141 - Batchelder , et al. April 12, 1	1994-04-12
Optical submicron aerosol particle detector Grant 5,294,806 - Batchelder , et al. March 15, 1	1994-03-15
Apparatus and a method for high numerical aperture microscopic examination of materials Grant 5,220,403 - Batchelder , et al. June 15, 1	1993-06-15
Apparatus and a method for high numerical aperture microscopic examination of materials Grant 5,208,648 - Batchelder , et al. May 4, 1	1993-05-04
Optical submicron aerosol particle detector Grant 5,192,870 - Batchelder , et al. March 9, 1	1993-03-09
Dark field imaging defect inspection system for repetitive pattern integrated circuits Grant 5,177,559 - Batchelder , et al. January 5, 1	1993-01-05
Particle path determination system Grant 5,133,602 - Batchelder , et al. July 28, 1	1992-07-28
Suppression of particle generation in a modified clean room corona air ionizer Grant 5,116,583 - Batchelder , et al. May 26, 1	1992-05-26
Measurement of size and refractive index of particles using the complex forward-scattered electromagnetic field Grant 5,037,202 - Batchelder , et al. August 6, 1	1991-08-06
System for automatic inspection of periodic patterns Grant 4,969,198 - Batchelder , et al. * November 6, 1	1990-11-06
System for automatic inspection of periodic patterns Grant 4,771,468 - Batchelder , et al. September 13, 1	1988-09-13
Semiconductor wafer surface inspection apparatus and method Grant 4,740,708 - Batchelder April 26, 1	1988-04-26

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