Baruch; Moshe
Patent Applications and Registrations
Patent applications and USPTO patent grants for Baruch; Moshe.The latest application filed is for "overlay metrology by pupil phase analysis".
- Baruch; Moshe - Misgav N/A IL
- Baruch; Moshe - D.N. Misgav N/A IL
| Patent | Date |
|---|---|
| Optics symmetrization for metrology Grant 9,164,397 - Manassen , et al. October 20, 2 | 2015-10-20 |
| Overlay metrology by pupil phase analysis Grant 8,582,114 - Manassen , et al. November 12, 2 | 2013-11-12 |
| Overlay Metrology By Pupil Phase Analysis App 20130044331 - Manassen; Amnon ; et al. | 2013-02-21 |
| Optics Symmetrization For Metrology App 20120033226 - Manassen; Amnon ; et al. | 2012-02-09 |
| Apparatus and methods for detecting overlay errors using scatterometry Grant 7,242,477 - Mieher , et al. July 10, 2 | 2007-07-10 |
| Apparatus and methods for detecting overlay errors using scatterometry App 20040233441 - Mieher, Walter D. ; et al. | 2004-11-25 |
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