Barnhart; Carl F.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Barnhart; Carl F..The latest application filed is for "partial good integrated circuit and method of testing same".
- Barnhart; Carl F. - Ojai CA
- Barnhart; Carl F. - Tucson AZ
| Patent | Date |
|---|---|
| Partial good integrated circuit and method of testing same Grant 7,478,301 - Farnsworth, III , et al. January 13, 2 | 2009-01-13 |
| Partial good integrated circuit and method of testing same Grant 7,434,129 - Farnsworth, III , et al. October 7, 2 | 2008-10-07 |
| Partial Good Integrated Circuit And Method Of Testing Same App 20080209289 - Farnsworth; Leonard O. ; et al. | 2008-08-28 |
| Partial Good Integrated Circuit And Method Of Testing Same App 20080010571 - Farnsworth; Leonard O. III ; et al. | 2008-01-10 |
| Partial good integrated circuit and method of testing same Grant 7,305,600 - Farnsworth, III , et al. December 4, 2 | 2007-12-04 |
| Partial good integrated circuit and method of testing same App 20050047224 - Farnsworth, Leonard O. III ; et al. | 2005-03-03 |
| Method for testing integrated logic circuits Grant 6,804,803 - Barnhart , et al. October 12, 2 | 2004-10-12 |
| Testing regularly structured logic circuits in integrated circuit devices Grant 6,795,944 - Barnhart September 21, 2 | 2004-09-21 |
| Method And Apparatus For Compact Scan Testing App 20040139377 - Barnhart, Carl F. ; et al. | 2004-07-15 |
| Method for testing integrated logic circuits App 20020147559 - Barnhart, Carl F. ; et al. | 2002-10-10 |
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