Barnett; Thomas S.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Barnett; Thomas S..The latest application filed is for "methods, apparatus, and program products to optimize semiconductor product yield prediction for performance and leakage screens".

Company Profile

0.7.9

Barnett; Thomas S. - Jericho VT
Barnett; Thomas S. - South Burlington VT
Barnett; Thomas S. - Royal Oak MI
Barnett; Thomas S. - Burlington VT

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods, apparatus, and program products to optimize semiconductor product yield prediction for performance and leakage screens Grant 7,917,451 - Barnett , et al. March 29, 2	2011-03-29
Methods, Apparatus, And Program Products To Optimize Semiconductor Product Yield Prediction For Performance And Leakage Screens App 20090234777 - Barnett; Thomas S. ; et al.	2009-09-17
Equivalent Gate Count Yield Estimation For Integrated Circuit Devices App 20090112352 - Barnett; Thomas S. ; et al.	2009-04-30
Equivalent gate count yield estimation for integrated circuit devices Grant 7,477,961 - Barnett , et al. January 13, 2	2009-01-13
System and method for estimating reliability of components for testing and quality optimization App 20080281541 - Singh; Adit D. ; et al.	2008-11-13
Carpenter saw transporter assembly Grant 7,416,193 - Barnett August 26, 2	2008-08-26
System and method for estimating reliability of components for testing and quality optimization Grant 7,409,306 - Singh , et al. August 5, 2	2008-08-05
Method For Improved Equivalent Gate Count Yield Estimation For Integrated Circuit Devices App 20070265722 - Barnett; Thomas S. ; et al.	2007-11-15
System and method for estimating reliability of components for testing and quality optimization App 20070162242 - Singh; Adit D. ; et al.	2007-07-12
System and method for estimating reliability of components for testing and quality optimization Grant 7,194,366 - Singh , et al. March 20, 2	2007-03-20
Method and system for determining minimum post production test time required on an integrated circuit device to achieve optimum reliability Grant 7,139,944 - Barbour , et al. November 21, 2	2006-11-21
Method And System For Determining Minimum Post Production Test Time Required On An Integrated Circuit Device To Achieve Optimum Reliability App 20050049810 - Barbour, Tange Nan ; et al.	2005-03-03
Method of statistical binning for reliability selection Grant 6,789,032 - Barbour , et al. September 7, 2	2004-09-07
Method for burn-in testing App 20030151422 - Barnett, Thomas S. ; et al.	2003-08-14
Method of statistical binning for reliability selection App 20030120445 - Barbour, Tange N. ; et al.	2003-06-26
System and method for estimating reliability of components for testing and quality optimization App 20030120457 - Singh, Adit D. ; et al.	2003-06-26

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