loadpatents
name:-0.030350923538208
name:-0.013090848922729
name:-0.0040960311889648
Barnes; Jeffrey A. Patent Filings

Barnes; Jeffrey A.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Barnes; Jeffrey A..The latest application filed is for "use of non-oxidizing strong acids for the removal of ion-implanted resist".

Company Profile
4.18.30
  • Barnes; Jeffrey A. - Danielsville PA
  • Barnes; Jeffrey A. - Bethlehem CT
  • Barnes; Jeffrey A. - Bath PA
  • Barnes; Jeffrey A. - New Milford CT
  • Barnes; Jeffrey A. - Nazareth PA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Post chemical mechanical polishing formulations and method of use
Grant 10,557,107 - Sun , et al. Feb
2020-02-11
Compositions and methods for selectively etching titanium nitride
Grant 10,392,560 - Barnes , et al. A
2019-08-27
Use of non-oxidizing strong acids for the removal of ion-implanted resist
Grant 10,347,504 - Bilodeau , et al. July 9, 2
2019-07-09
Ni:NiGe:Ge selective etch formulations and method of using same
Grant 10,340,150 - Bilodeau , et al.
2019-07-02
Post-CMP removal using compositions and method of use
Grant 10,176,979 - Liu , et al. J
2019-01-08
Use Of Non-oxidizing Strong Acids For The Removal Of Ion-implanted Resist
App 20180240680 - Bilodeau; Steven ;   et al.
2018-08-23
Composition and process for selectively etching metal nitrides
Grant 9,831,088 - Chen , et al. November 28, 2
2017-11-28
Compositions And Methods For Selectively Etching Titanium Nitride
App 20170260449 - BARNES; Jeffrey A. ;   et al.
2017-09-14
Compositions and methods for selectively etching titanium nitride
Grant 9,546,321 - Barnes , et al. January 17, 2
2017-01-17
Post Chemical Mechanical Polishing Formulations And Method Of Use
App 20160340620 - SUN; Laisheng ;   et al.
2016-11-24
Use Of Non-oxidizing Strong Acids For The Removal Of Ion-implanted Resist
App 20160322232 - BILODEAU; Steven ;   et al.
2016-11-03
Ni:nige:ge Selective Etch Formulations And Method Of Using Same
App 20160314990 - BILODEAU; Steven ;   et al.
2016-10-27
Non-amine Post-cmp Composition And Method Of Use
App 20160237385 - BARNES; Jeffrey A. ;   et al.
2016-08-18
Non-amine post-CMP composition and method of use
Grant 9,340,760 - Barnes , et al. May 17, 2
2016-05-17
Copper Cleaning And Protection Formulations
App 20160075971 - LIU; Jun ;   et al.
2016-03-17
Copper Cleaning And Protection Formulations
App 20160032221 - Barnes; Jeffrey A. ;   et al.
2016-02-04
Post-cmp Removal Using Compositions And Method Of Use
App 20160020087 - LIU; Jun ;   et al.
2016-01-21
Aqueous Cleaner For The Removal Of Post-etch Residues
App 20150307818 - Barnes; Jeffrey A. ;   et al.
2015-10-29
Copper cleaning and protection formulations
Grant 9,074,170 - Barnes , et al. July 7, 2
2015-07-07
Aqueous cleaner for the removal of post-etch residues
Grant 9,063,431 - Barnes , et al. June 23, 2
2015-06-23
Formulations For Wet Etching Nipt During Silicide Fabrication
App 20150162213 - Chen; Tianniu ;   et al.
2015-06-11
Compositions And Methods For Selectively Etching Titanium Nitride
App 20150027978 - Barnes; Jeffrey A. ;   et al.
2015-01-29
Non-amine Post-cmp Composition And Method Of Use
App 20140352739 - BARNES; Jeffrey A. ;   et al.
2014-12-04
Formulations For The Removal Of Particles Generated By Cerium-containing Solutions
App 20140318584 - Cooper; Emanuel I. ;   et al.
2014-10-30
Non-amine post-CMP composition and method of use
Grant 8,754,021 - Barnes , et al. June 17, 2
2014-06-17
Composition And Process For Selectively Etching Metal Nitrides
App 20140038420 - Chen; Tianniu ;   et al.
2014-02-06
Aqueous Cleaner For The Removal Of Post-etch Residues
App 20130296214 - Barnes; Jeffrey A. ;   et al.
2013-11-07
Copper Cleaning And Protection Formulations
App 20120283163 - Barnes; Jeffrey A. ;   et al.
2012-11-08
Non-amine Post-cmp Composition And Method Of Use
App 20120028870 - Barnes; Jeffrey A. ;   et al.
2012-02-02
Compositions for processing of semiconductor substrates
Grant 7,922,823 - Walker , et al. April 12, 2
2011-04-12
Low Ph Post-cmp Residue Removal Composition And Method Of Use
App 20100286014 - Barnes; Jeffrey A.
2010-11-11
Compositions For Processing Of Semiconductor Substrates
App 20100056409 - Walker; Elizabeth ;   et al.
2010-03-04
Aqueous Cleaner With Low Metal Etch Rate
App 20080200361 - Walker; Elizabeth L. ;   et al.
2008-08-21
Aqueous cleaner with low metal etch rate comprising alkanolamine and tetraalkylammonium hydroxide
Grant 7,365,045 - Walker , et al. April 29, 2
2008-04-29
Copper passivating post-chemical mechanical polishing cleaning composition and method of use
App 20080076688 - Barnes; Jeffrey A. ;   et al.
2008-03-27
Aqueous cleaner with low metal etch rate
App 20060229221 - Walker; Elizabeth L. ;   et al.
2006-10-12
Aqueous cleaner with low metal etch rate
App 20060148666 - Peters; Darryl W. ;   et al.
2006-07-06
Method for monitoring surface treatment of copper containing devices
App 20050145311 - Walker, Elizabeth L. ;   et al.
2005-07-07

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