Barlett; Darryl

Patent Applications and Registrations

Patent applications and USPTO patent grants for Barlett; Darryl.The latest application filed is for "real-time temperature, optical band gap, film thickness, and surface roughness measurement for thin films applied to transparent substrates".

Company Profile

0.8.8

Barlett; Darryl - Dexter MI US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing Grant 9,239,265 - Taylor, II , et al. January 19, 2	2016-01-19
Non-contact, optical sensor for synchronizing to free rotating sample platens with asymmetry Grant 9,030,652 - Hines , et al. May 12, 2	2015-05-12
Thin film temperature measurement using optical absorption edge wavelength Grant 8,786,841 - Barlett , et al. July 22, 2	2014-07-22
Real-time Temperature, Optical Band Gap, Film Thickness, And Surface Roughness Measurement For Thin Films Applied To Transparent Substrates App 20130321805 - Barlett; Darryl ; et al.	2013-12-05
Non-contact, Optical Sensor For Synchronizing To Free Rotating Sample Platens With Asymmetry App 20130141711 - Hines; Scott ; et al.	2013-06-06
Blackbody fitting for temperature determination Grant 8,282,273 - Barlett , et al. October 9, 2	2012-10-09
Thin Film Temperature Measurement Using Optical Absorption Edge Wavelength App 20120133934 - Barlett; Darryl ; et al.	2012-05-31
Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing Grant 7,837,383 - Taylor, II , et al. November 23, 2	2010-11-23
Apparatus And Method For Real Time Measurement Of Substrate Temperatures For Use In Semiconductor Growth And Wafer Processing App 20100274523 - Taylor, II; Charles A. ; et al.	2010-10-28
Blackbody Fitting For Temperature Determination App 20100246631 - Barlett; Darryl ; et al.	2010-09-30
Apparatus And Method For Real Time Measurement Of Substrate Temperatures For Use In Semiconductor Growth And Wafer Processing App 20090177432 - Taylor, II; Charles A. ; et al.	2009-07-09
Curvature/tilt metrology tool with closed loop feedback control Grant 7,391,523 - Taylor, II , et al. June 24, 2	2008-06-24
Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing App 20050106876 - Taylor, Charles A. II ; et al.	2005-05-19

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