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Patent applications and USPTO patent grants for Barbes; Damien.The latest application filed is for "system and method for estimating a quantity of interest based on an image of a histological section".
Patent | Date |
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System And Method For Estimating A Quantity Of Interest Based On An Image Of A Histological Section App 20200349700 - Gilhodes; Jean-Claude ;   et al. | 2020-11-05 |
Method of calibrating an X ray diffraction analysis system Grant 10,386,508 - Tabary , et al. A | 2019-08-20 |
Method for analyzing an object by X-ray diffraction Grant 10,371,651 - Barbes , et al. | 2019-08-06 |
Method For Analyzing An Object By X-ray Diffraction App 20170184518 - BARBES; Damien ;   et al. | 2017-06-29 |
Method Of Calibrating An X Ray Diffraction Analysis System App 20170184739 - TABARY; Joachim ;   et al. | 2017-06-29 |
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