loadpatents
name:-0.0079061985015869
name:-0.025458812713623
name:-0.00063610076904297
Barbee; Steven G. Patent Filings

Barbee; Steven G.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Barbee; Steven G..The latest application filed is for "predicting service request breaches".

Company Profile
0.24.6
  • Barbee; Steven G. - Amenia NY US
  • Barbee; Steven G. - Dover Plains NY
  • Barbee; Steven G. - Dutchess County NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Predicting service request breaches
Grant 9,189,543 - Badhe , et al. November 17, 2
2015-11-17
Predicting Service Request Breaches
App 20130132060 - Badhe; Yogesh P. ;   et al.
2013-05-23
Data mining using variable rankings and enhanced visualization methods
Grant 7,895,168 - Barbee , et al. February 22, 2
2011-02-22
Data Mining Using Variable Rankings And Enhanced Visualization Methods
App 20090177682 - Barbee; Steven G. ;   et al.
2009-07-09
Methods of fabricating optimization involving process sequence analysis
Grant 7,502,658 - Barbee , et al. March 10, 2
2009-03-10
Enhanced endpoint detection for wet etch process control
Grant 6,989,683 - Li , et al. January 24, 2
2006-01-24
Apparatus for detecting CMP endpoint in acidic slurries
Grant 6,899,784 - Li , et al. May 31, 2
2005-05-31
Method for detecting CMP endpoint in acidic slurries
Grant 6,878,629 - Li , et al. April 12, 2
2005-04-12
Low defect pre-emitter and pre-base oxide etch for bipolar transistors and related tooling
Grant 6,858,532 - Natzle , et al. February 22, 2
2005-02-22
Enhanced endpoint detection for wet etch process control
Grant 6,843,880 - Li , et al. January 18, 2
2005-01-18
Enhanced endpoint detection for wet etch process control
App 20050006027 - Li, Leping ;   et al.
2005-01-13
Low defect pre-emitter and pre-base oxide etch for bipolar transistors and related tooling
App 20040110354 - Natzle, Wesley C. ;   et al.
2004-06-10
Enhanced endpoint detection for wet etch process control
App 20030217990 - Li, Leping ;   et al.
2003-11-27
Apparatus for chemical vapor deposition of aluminum oxide
Grant 5,614,247 - Barbee , et al. March 25, 1
1997-03-25
Real time measurement of etch rate during a chemical etching process
Grant 5,582,746 - Barbee , et al. December 10, 1
1996-12-10
In-situ monitoring of the change in thickness of films
Grant 5,559,428 - Li , et al. September 24, 1
1996-09-24
Contactless real-time in-situ monitoring of a chemical etching
Grant 5,516,399 - Balconi-Lamica , et al. May 14, 1
1996-05-14
Minimizing overetch during a chemical etching process
Grant 5,501,766 - Barbee , et al. March 26, 1
1996-03-26
Real time measurement of etch rate during a chemical etching process
Grant 5,500,073 - Barbee , et al. March 19, 1
1996-03-19
Method and apparatus for real-time, in-situ endpoint detection and closed loop etch process control
Grant 5,392,124 - Barbee , et al. February 21, 1
1995-02-21
In situ, non-destructive CVD surface monitor
Grant 5,386,121 - Barbee , et al. January 31, 1
1995-01-31
Contactless real-time in-situ monitoring of a chemical etching process
Grant 5,338,390 - Barbee , et al. August 16, 1
1994-08-16
Interferometer for in situ measurement of thin film thickness changes
Grant 5,220,405 - Barbee , et al. June 15, 1
1993-06-15
LPCVD reactor for high efficiency, high uniformity deposition
Grant 5,134,963 - Barbee , et al. August 4, 1
1992-08-04
Strengthening a ceramic by post sinter coating with a compressive surface layer
Grant 4,781,970 - Barbee , et al. November 1, 1
1988-11-01
Method for vacuum vapor deposition with improved mass flow control
Grant 4,717,596 - Barbee , et al. January 5, 1
1988-01-05
Vacuum deposition system with improved mass flow control
Grant 4,640,221 - Barbee , et al. February 3, 1
1987-02-03
Thin film semiconductor device and method for manufacture
Grant 4,400,715 - Barbee , et al. August 23, 1
1983-08-23

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