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Patent applications and USPTO patent grants for Baram; Mor.The latest application filed is for "measuring height difference in patterns on semiconductor wafers".
Patent | Date |
---|---|
Measuring height difference in patterns on semiconductor wafers Grant 11,301,983 - Schwarzband , et al. April 12, 2 | 2022-04-12 |
Measuring Height Difference In Patterns On Semiconductor Wafers App 20200380668 - Schwarzband; Ishai ;   et al. | 2020-12-03 |
Measuring height difference in patterns on semiconductor wafers Grant 10,748,272 - Schwarzband , et al. A | 2020-08-18 |
Evaluating an object Grant 10,504,693 - Attal , et al. Dec | 2019-12-10 |
Evaluating An Object App 20190088444 - Attal; Shay ;   et al. | 2019-03-21 |
Measuring Height Difference In Patterns On Semiconductor Wafers App 20180336675 - SCHWARZBAND; Ishai ;   et al. | 2018-11-22 |
Resolving ambiguities in an energy spectrum Grant 9,899,185 - Shemesh , et al. February 20, 2 | 2018-02-20 |
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