Banzhof; Helmut

Patent Applications and Registrations

Patent applications and USPTO patent grants for Banzhof; Helmut.The latest application filed is for "charged particle beam device and a method of operating a charged particle beam device".

Company Profile

0.12.12

Banzhof; Helmut - Poing DE
Banzhof; Helmut - 85596 Poing DE
Banzhof; Helmut - Pfullingen DE
Banzhof; Helmut - Heimstetten DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Multi-beam scanning electron beam device and methods of using the same Grant 9,153,413 - Almogy , et al. October 6, 2	2015-10-06
High resolution gas field ion column with reduced sample load Grant 8,735,847 - Banzhof , et al. May 27, 2	2014-05-27
Charged particle beam device and a method of operating a charged particle beam device Grant 8,294,096 - Banzhof October 23, 2	2012-10-23
Arrangement and method for the contrast improvement in a charged particle beam device for inspecting a specimen Grant 8,164,067 - Adamec , et al. April 24, 2	2012-04-24
Achromatic mass separator Grant 8,049,180 - Frosien , et al. November 1, 2	2011-11-01
Charged Particle Beam Device And A Method Of Operating A Charged Particle Beam Device App 20110253893 - BANZHOF; Helmut	2011-10-20
High Throughput Sem Tool App 20110163229 - Frosien; Juergen ; et al.	2011-07-07
High Throughput Sem Tool App 20100320382 - Almogy; Gilad ; et al.	2010-12-23
Charged particle beam apparatus and method for operating a charged particle beam apparatus Grant 7,838,830 - Frosien , et al. November 23, 2	2010-11-23
Multi-function module for an electron beam column Grant 7,800,075 - Buller , et al. September 21, 2	2010-09-21
Arrangement And Method For The Contrast Improvement In A Charged Particle Beam Device For Inspecting A Specimen App 20100200748 - ADAMEC; Pavel ; et al.	2010-08-12
Charged particle beam device with aperture Grant 7,763,866 - Frosien , et al. July 27, 2	2010-07-27
High Resolution Gas Field Ion Column With Reduced Sample Load App 20090146074 - BANZHOF; Helmut ; et al.	2009-06-11
Multi-function Module For An Electron Beam Column App 20080308751 - Buller; Benyamin ; et al.	2008-12-18
Charged Particle Beam Apparatus And Method For Operating A Charged Particle Beam Apparatus App 20080258060 - FROSIEN; JUERGEN ; et al.	2008-10-23
Electron beam column for writing shaped electron beams Grant 7,427,765 - Buller , et al. September 23, 2	2008-09-23
Achromatic Mass Separator App 20080185514 - FROSIEN; JUERGEN ; et al.	2008-08-07
Ion Beam Apparatus And Method For Aligning Same App 20080073583 - JASINSKI; Thomas ; et al.	2008-03-27
Charged Particle Beam Device with Aperture App 20070257207 - Frosien; Jurgen ; et al.	2007-11-08
Multiple electron beam device Grant 7,282,711 - Winkler , et al. October 16, 2	2007-10-16
Electron beam column for writing shaped electron beams App 20070085033 - Buller; Benyamin ; et al.	2007-04-19
Multiple electron beam device App 20040256556 - Winkler, Dieter ; et al.	2004-12-23

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