| Patent | Date |
|---|
Display apparatus
Grant 9,426,890 - Jang , et al. August 23, 2 | 2016-08-23 |
Display Apparatus
App 20150245488 - JANG; Hyo Jae ; et al. | 2015-08-27 |
Display Device And Manufacturing Method Thereof
App 20150212378 - HWANG; Eui-Dong ; et al. | 2015-07-30 |
Handoff system and method between different kinds of devices, SIP server and operational method of SIP server
Grant 8,018,899 - Oh , et al. September 13, 2 | 2011-09-13 |
Test apparatus having multiple head boards at one handler and its test method
Grant 7,602,172 - Chung , et al. October 13, 2 | 2009-10-13 |
Fuse regions of a semiconductor memory device and methods of fabricating the same
Grant 7,492,032 - Bang , et al. February 17, 2 | 2009-02-17 |
Connector for testing a semiconductor package
Grant 7,438,563 - Chung , et al. October 21, 2 | 2008-10-21 |
Test Apparatus Having Multiple Test Sites At One Handler And Its Test Method
App 20080197874 - CHUNG; Ae-Yong ; et al. | 2008-08-21 |
Test system of semiconductor device having a handler remote control and method of operating the same
Grant 7,408,339 - Chung , et al. August 5, 2 | 2008-08-05 |
Test apparatus having multiple test sites at one handler and its test method
Grant 7,378,864 - Chung , et al. May 27, 2 | 2008-05-27 |
Multichip package test
Grant 7,327,154 - Shin , et al. February 5, 2 | 2008-02-05 |
Test System Of Semiconductor Device Having A Handler Remote Control And Method Of Operating The Same
App 20070290707 - CHUNG; Ae-Yong ; et al. | 2007-12-20 |
Flash memory test system and method capable of test time reduction
Grant 7,254,757 - Park , et al. August 7, 2 | 2007-08-07 |
Test system of semiconductor device having a handler remote control and method of operating the same
Grant 7,230,417 - Chung , et al. June 12, 2 | 2007-06-12 |
Apparatus and method for performing parallel test on integrated circuit devices
Grant 7,227,351 - Kim , et al. June 5, 2 | 2007-06-05 |
Handoff system and method between different kinds of devices, SIP server and operational method of SIP server
App 20060187943 - Oh; Se-jong ; et al. | 2006-08-24 |
Test kit semiconductor package and method of testing semiconductor package using the same
App 20060187647 - Iy; Hyun-Guen ; et al. | 2006-08-24 |
Burn-in test apparatus for BGA packages using forced heat exhaust
Grant 7,084,655 - Min , et al. August 1, 2 | 2006-08-01 |
Test system of semiconductor device having a handler remote control and method of operating the same
App 20060158211 - Chung; Ae-Yong ; et al. | 2006-07-20 |
Connector for testing a semiconductor package
App 20060121757 - Chung; Young-Bae ; et al. | 2006-06-08 |
Test board of semiconductor tester having modified input/output printed circuit pattern and testing method using the same
App 20060085715 - Kim; Yong-Woon ; et al. | 2006-04-20 |
Test kit for semiconductor package and method for testing semiconductor package using the same
Grant 7,017,428 - Min , et al. March 28, 2 | 2006-03-28 |
Multichip package test
App 20050258858 - Shin, Young-Gu ; et al. | 2005-11-24 |
Method for electrical testing of semiconductor package that detects socket defects in real time
Grant 6,960,908 - Chung , et al. November 1, 2 | 2005-11-01 |
Fuse regions of a semiconductor memory device and methods of fabricating the same
App 20050236688 - Bang, Kwang-Kyu ; et al. | 2005-10-27 |
Multichip package test
Grant 6,943,577 - Shin , et al. September 13, 2 | 2005-09-13 |
Burn-in test apparatus for BGA packages using forced heat exhaust
App 20050179457 - Min, Byung-Jun ; et al. | 2005-08-18 |
Test apparatus having multiple test sites at one handler and its test method
App 20050168236 - Chung, Ae-Yong ; et al. | 2005-08-04 |
Method for testing a remnant batch of semiconductor devices
Grant 6,922,050 - Chung , et al. July 26, 2 | 2005-07-26 |
Test apparatus having multiple test sites at one handler and its test method
Grant 6,903,567 - Chung , et al. June 7, 2 | 2005-06-07 |
Flash memory test system and method capable of test time reduction
App 20050102589 - Park, Dong-Kyoo ; et al. | 2005-05-12 |
Integrated circuit with improved output control signal and method for generating improved output control signal
Grant 6,879,541 - Bang April 12, 2 | 2005-04-12 |
Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same
Grant 6,861,682 - Bang , et al. March 1, 2 | 2005-03-01 |
Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell
Grant 6,850,450 - Bang , et al. February 1, 2 | 2005-02-01 |
Apparatus and method for performing parallel test on integrated circuit devices
App 20050007140 - Kim, Woo-Il ; et al. | 2005-01-13 |
Wafer treatment method for protecting fuse box of semiconductor chip
Grant 6,841,425 - Lee , et al. January 11, 2 | 2005-01-11 |
Method of electrically testing semiconductor devices
Grant 6,842,031 - Koh , et al. January 11, 2 | 2005-01-11 |
Method for testing a remnant batch of semiconductor devices
App 20040253753 - Chung, Ae-yong ; et al. | 2004-12-16 |
Integrated circuit with improved output control signal and method for generating improved output control signal
App 20040218428 - Bang, Jeong-Ho | 2004-11-04 |
Pipe latch circuit for outputting data with high speed
Grant 6,813,195 - Bang , et al. November 2, 2 | 2004-11-02 |
Method for electrical testing of semiconductor package that detects socket defects in real time
App 20040207387 - Chung, Ae-yong ; et al. | 2004-10-21 |
Integrated monitoring burn-in test method for multi-chip package
App 20040145387 - Yun, Geum-Jin ; et al. | 2004-07-29 |
Multichip package test
App 20040119491 - Shin, Young-Gu ; et al. | 2004-06-24 |
Test kit for semiconductor package and method for testing semiconductor package using the same
App 20040112142 - Min, Byoung-Jun ; et al. | 2004-06-17 |
Pipe latch circuit for outputting data with high speed
App 20040095178 - Bang, Jeong-Ho ; et al. | 2004-05-20 |
Test apparatus having multiple test sites at one handler and its test method
App 20040061491 - Chung, Ae-Yong ; et al. | 2004-04-01 |
Plasma display panel apparatus and method of protecting an over current thereof
Grant 6,710,550 - Bang March 23, 2 | 2004-03-23 |
Apparatus for generating dynamic focus signal
Grant 6,700,337 - Bang March 2, 2 | 2004-03-02 |
Broadband switching drive compensating circuit for a video display device
Grant 6,686,929 - Bang February 3, 2 | 2004-02-03 |
Method of electrically testing semiconductor devices
App 20030184335 - Koh, Gil-Young ; et al. | 2003-10-02 |
Plasma display panel apparatus and method of protecting an over current thereof
App 20030137254 - Bang, Jeong-ho | 2003-07-24 |
Parallel testing system for semiconductor memory devices
App 20030115519 - Kwon, Hyuk ; et al. | 2003-06-19 |
Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same
App 20030095451 - Bang, Jeong-Ho ; et al. | 2003-05-22 |
Wafer treatment method for protecting fuse box of semiconductor chip
App 20030080360 - Lee, Jae-Il ; et al. | 2003-05-01 |
Apparatus for generating dynamic focus signal
App 20030034745 - Bang, Jeong-Ho | 2003-02-20 |
Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell
App 20030026147 - Bang, Kwang-Kyu ; et al. | 2003-02-06 |
Socket including pressure conductive rubber and mesh for testing of ball grid array package
Grant 6,489,790 - An , et al. December 3, 2 | 2002-12-03 |
Semiconductor package testing equipment including loader having package guider and method of loading a semiconductor package onto a test socket as aligned therewith
Grant 6,462,534 - Kang , et al. October 8, 2 | 2002-10-08 |
Method and apparatus for detecting defective markings on a semiconductor product
App 20020092910 - Lim, Sung-Muk ; et al. | 2002-07-18 |
Broadband switching drive compensating circuit for a video display device
App 20020044146 - Bang, Jeong-Ho | 2002-04-18 |
Semiconductor package testing equipment including loader having package guider and method of loading a semiconductor package onto a test socket as aligned therewith
App 20010026152 - Kang, Seong-goo ; et al. | 2001-10-04 |
Test method for high speed memory devices in which limit conditions for the clock are defined
Grant 6,201,746 - Koo , et al. March 13, 2 | 2001-03-13 |
Chip separation device and method
Grant 6,121,118 - Jin , et al. September 19, 2 | 2000-09-19 |
Surge protection circuit for a switching mode power supply
Grant 5,621,625 - Bang April 15, 1 | 1997-04-15 |
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