Baney; Douglas Michael
Patent Applications and Registrations
Patent applications and USPTO patent grants for Baney; Douglas Michael.The latest application filed is for "systems and methods for calibrating a wafer inspection apparatus".
- Baney; Douglas Michael - Santa Clara CA
- Baney; Douglas Michael - Los Altos CA
| Patent | Date |
|---|---|
| Systems and methods for calibrating a wafer inspection apparatus Grant 11,061,099 - Baney July 13, 2 | 2021-07-13 |
| Systems And Methods For Calibrating A Wafer Inspection Apparatus App 20200088829 - Baney; Douglas Michael | 2020-03-19 |
| Systems and methods for thermal imaging of RF signals Grant 10,458,851 - Lee , et al. Oc | 2019-10-29 |
| Systems And Methods For Thermal Imaging Of Rf Signals App 20190242755 - Lee; Gregory Steven ; et al. | 2019-08-08 |
| Measurement of polarization-resolved optical scattering parameters Grant 6,940,594 - Tucker , et al. September 6, 2 | 2005-09-06 |
| Measurement of polarization-resolved optical scattering parameters App 20030231310 - Tucker, Rodney S. ; et al. | 2003-12-18 |
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