loadpatents
name:-0.012235879898071
name:-0.010398864746094
name:-0.0029802322387695
Ban; Naoma Patent Filings

Ban; Naoma

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ban; Naoma.The latest application filed is for "beam irradiation device".

Company Profile
3.12.11
  • Ban; Naoma - Tokyo JP
  • Ban; Naoma - Hitachinaka JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Beam irradiation device
Grant 11,239,042 - Ikegami , et al. February 1, 2
2022-02-01
Charged-particle beam device
Grant 11,056,310 - Kawamoto , et al. July 6, 2
2021-07-06
Beam Irradiation Device
App 20210027976 - IKEGAMI; Akira ;   et al.
2021-01-28
Beam irradiation device
Grant 10,832,886 - Ikegami , et al. November 10, 2
2020-11-10
Charged-Particle Beam Device
App 20190393014 - KAWAMOTO; Yuta ;   et al.
2019-12-26
Beam Irradiation Device
App 20190287754 - IKEGAMI; Akira ;   et al.
2019-09-19
Charged particle beam apparatus
Grant 9,177,757 - Ban , et al. November 3, 2
2015-11-03
Surface observation apparatus and surface observation method
Grant 9,136,189 - Hirai , et al. September 15, 2
2015-09-15
Charged Particle Beam Apparatus
App 20150170875 - Ban; Naoma ;   et al.
2015-06-18
Observation method and observation device
Grant 8,878,925 - Ban , et al. November 4, 2
2014-11-04
Scanning electron microscope and sample observation method
Grant 8,519,334 - Tadaka , et al. August 27, 2
2013-08-27
Scanning Electron Microscope And Sample Observation Method
App 20130037716 - Tadaka; Satoshi ;   et al.
2013-02-14
Observation Method And Observation Device
App 20120300056 - Ban; Naoma ;   et al.
2012-11-29
Charged particle beam apparatus and displacement detecting circuit
Grant 8,125,647 - Tsuji , et al. February 28, 2
2012-02-28
Surface Observation Apparatus And Surface Observation Method
App 20120044262 - Hirai; Takehiro ;   et al.
2012-02-23
Review method and review device
Grant 8,013,299 - Obara , et al. September 6, 2
2011-09-06
Charged Particle Beam Apparatus And Displacement Detecting Circuit
App 20090225326 - Tsuji; Hiroshi ;   et al.
2009-09-10
Review Method And Review Device
App 20090206259 - Obara; Kenji ;   et al.
2009-08-20
Report Search Method, Report Search System, and Reviewing Apparatus
App 20080263028 - Hirai; Takehiro ;   et al.
2008-10-23

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed