Balog; Gil

Patent Applications and Registrations

Patent applications and USPTO patent grants for Balog; Gil.The latest application filed is for "systems and methods for test time outlier detection and correction in integrated circuit testing".

Company Profile

0.18.17

Balog; Gil - Jerusalum N/A IL
Balog; Gil - Jerusalem IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for binning at final test Grant 10,118,200 - Linde , et al. November 6, 2	2018-11-06
Systems and methods for test time outlier detection and correction in integrated circuit testing Grant 9,529,036 - Balog , et al. December 27, 2	2016-12-27
Systems And Methods For Test Time Outlier Detection And Correction In Integrated Circuit Testing App 20150012237 - Balog; Gil ; et al.	2015-01-08
Systems and methods for test time outlier detection and correction in integrated circuit testing Grant 8,872,538 - Balog , et al. October 28, 2	2014-10-28
System and methods for parametric testing Grant 8,781,773 - Gurov , et al. July 15, 2	2014-07-15
Systems And Methods For Test Time Outlier Detection And Correction In Integrated Circuit Testing App 20130193994 - Balog; Gil ; et al.	2013-08-01
Systems and methods for test time outlier detection and correction in integrated circuit testing Grant 8,421,494 - Balog , et al. April 16, 2	2013-04-16
Methods And Systems For Semiconductor Testing Using A Testing Scenario Language App 20120109874 - Balog; Gil	2012-05-03
System and methods for parametric test time reduction Grant 8,112,249 - Gurov , et al. February 7, 2	2012-02-07
Methods and systems for semiconductor testing using a testing scenario language Grant 8,069,130 - Balog November 29, 2	2011-11-29
System And Methods For Parametric Testing App 20110251812 - GUROV; Leonid ; et al.	2011-10-13
Systems And Methods For Test Time Outlier Detection And Correction In Integrated Circuit Testing App 20110224938 - Balog; Gil ; et al.	2011-09-15
Systems and methods for test time outlier detection and correction in integrated circuit testing Grant 7,969,174 - Balog , et al. June 28, 2	2011-06-28
Methods and systems for semiconductor testing using reference dice Grant 7,777,515 - Balog August 17, 2	2010-08-17
System and Methods for Parametric Test Time Reduction App 20100161276 - Gurov; Leonid ; et al.	2010-06-24
Methods and systems for semiconductor testing using reference dice Grant 7,737,716 - Balog June 15, 2	2010-06-15
Methods and systems for semiconductor testing using reference dice Grant 7,679,392 - Balog March 16, 2	2010-03-16
Methods And Systems For Semiconductor Testing Using A Testing Scenario Language App 20090265300 - Balog; Gil	2009-10-22
Systems And Methods For Test Time Outlier Detection And Correction In Integrated Circuit Testing App 20090192754 - Balog; Gil ; et al.	2009-07-30
Methods and systems for semiconductor testing using a testing scenario language Grant 7,567,947 - Balog July 28, 2	2009-07-28
Methods and systems for semiconductor testing using reference dice Grant 7,532,024 - Balog May 12, 2	2009-05-12
Methods And Systems For Semiconductor Testing Using Reference Dice App 20090119048 - Balog; Gil	2009-05-07
Methods And Systems For Semiconductor Testing Using Reference Dice App 20090115445 - Balog; Gil	2009-05-07
Methods for slow test time detection of an integrated circuit during parallel testing Grant 7,528,622 - Balog , et al. May 5, 2	2009-05-05
Methods And Systems For Semiconductor Testing Using Reference Dice App 20090112501 - Balog; Gil	2009-04-30
Datalog Management In Semiconductor Testing App 20090013218 - ROUSSEAU; Eran ; et al.	2009-01-08
Augmenting semiconductor's devices quality and reliability App 20080114558 - Erez; Nir ; et al.	2008-05-15
Augmenting semiconductor's devices quality and reliability Grant 7,340,359 - Erez , et al. March 4, 2	2008-03-04
Methods and systems for semiconductor testing using reference dice App 20080007284 - Balog; Gil	2008-01-10
Methods and systems for semiconductor testing using a testing scenario language App 20070233629 - Balog; Gil	2007-10-04
System and methods for test time outlier detection and correction in integrated circuit testing App 20070132477 - Balog; Gil ; et al.	2007-06-14
Augmenting semiconductor's devices quality and reliability App 20060267577 - Erez; Nir ; et al.	2006-11-30

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