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Patent applications and USPTO patent grants for Balachandran; Hari.The latest application filed is for "simultaneous scan testing for identical modules".
Patent | Date |
---|---|
Simultaneous scan testing for identical modules App 20060242508 - Simpson; Neil John ;   et al. | 2006-10-26 |
All digital built-in self-test circuit for phase-locked loops Grant 6,661,266 - Variyam , et al. December 9, 2 | 2003-12-09 |
System and method for pruning a bridging diagnostic list Grant 6,618,830 - Balachandran , et al. September 9, 2 | 2003-09-09 |
Method and apparatus for efficient burn-in of electronic circuits App 20030149913 - Balachandran, Hari ;   et al. | 2003-08-07 |
System for mapping logical functional test data of logical integrated circuits to physical representation using pruned diagnostic list App 20020010560 - Balachandran, Hari | 2002-01-24 |
IC test software system for mapping logical functional test data of logic integrated circuits to physical representation Grant 6,185,707 - Smith , et al. February 6, 2 | 2001-02-06 |
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