loadpatents
name:-0.014111042022705
name:-0.031820058822632
name:-0.021734952926636
Bakin; Dmitry V. Patent Filings

Bakin; Dmitry V.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Bakin; Dmitry V..The latest application filed is for "high-resolution autostereoscopic display and method for displaying three-dimensional images".

Company Profile
1.6.4
  • Bakin; Dmitry V. - San Jose CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Free space optical communication terminal with wavelength dependent optic
Grant 11,005,565 - Mitchell , et al. May 11, 2
2021-05-11
High-resolution Autostereoscopic Display And Method For Displaying Three-dimensional Images
App 20060238545 - Bakin; Dmitry V. ;   et al.
2006-10-26
Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
Grant 7,042,581 - Schietinger , et al. May 9, 2
2006-05-09
Optical cross-connect switch with telecentric lens and multi-surface optical element
Grant 7,027,232 - Bakin , et al. April 11, 2
2006-04-11
Optical cross-connect switch with telecentric lens and multi-surface optical element
Grant 6,985,299 - Bakin , et al. January 10, 2
2006-01-10
Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
Grant 6,934,040 - Schietinger , et al. August 23, 2
2005-08-23
Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
App 20050105103 - Schietinger, Charles W. ;   et al.
2005-05-19
Optical cross-connect switch with telecentric lens and multi-surface optical element
App 20050024736 - Bakin, Dmitry V. ;   et al.
2005-02-03
Optical cross-connect switch with telecentric lens and multi-surface optical element
App 20040145817 - Bakin, Dmitry V. ;   et al.
2004-07-29
Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
Grant 6,654,132 - Schietinger , et al. November 25, 2
2003-11-25
Company Registrations

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