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Patent applications and USPTO patent grants for Baker; Bruce D..The latest application filed is for "learning method and apparatus for detecting and controlling solder defects".
Patent | Date |
---|---|
Learning method and apparatus for detecting and controlling solder defects Grant 5,621,811 - Roder , et al. April 15, 1 | 1997-04-15 |
Method and apparatus for inspecting electrical connections Grant 5,561,696 - Adams , et al. October 1, 1 | 1996-10-01 |
Method and apparatus for detecting excess/insufficient solder defects Grant 5,291,535 - Baker , et al. * March 1, 1 | 1994-03-01 |
Laminography system and method with electromagnetically directed multipath radiation source Grant 5,259,012 - Baker , et al. November 2, 1 | 1993-11-02 |
Method and apparatus for high resolution inspection of electronic items Grant 5,199,054 - Adams , et al. March 30, 1 | 1993-03-30 |
Automated laminography system for inspection of electronics Grant 5,097,492 - Baker , et al. * March 17, 1 | 1992-03-17 |
Automated laminography system for inspection of electronics Grant 5,081,656 - Baker , et al. January 14, 1 | 1992-01-14 |
Automated laminography system for inspection of electronics Grant 4,926,452 - Baker , et al. May 15, 1 | 1990-05-15 |
SEC | 0001834035 | Baker Bruce D |
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