loadpatents
name:-0.021492958068848
name:-0.02083683013916
name:-0.0013558864593506
Bailey; Todd C. Patent Filings

Bailey; Todd C.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Bailey; Todd C..The latest application filed is for "process-metrology reproducibility bands for lithographic photomasks".

Company Profile
1.26.20
  • Bailey; Todd C. - Poughkeepsie NY
  • Bailey; Todd C. - Fishkill NY US
  • Bailey; Todd C. - Hopewell Junction NY US
  • Bailey; Todd C - Poughkeepsie NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Process-metrology reproducibility bands for lithographic photomasks
Grant 10,210,292 - Bailey , et al. Feb
2019-02-19
Process-metrology Reproducibility Bands For Lithographic Photomasks
App 20180101630 - Bailey; Todd C. ;   et al.
2018-04-12
Process-metrology reproducibility bands for lithographic photomasks
Grant 9,928,316 - Bailey , et al. March 27, 2
2018-03-27
Process-metrology Reproducibility Bands For Lithographic Photomasks
App 20160283617 - Bailey; Todd C. ;   et al.
2016-09-29
Method of automatic fluid dispensing for imprint lithography processes
Grant 9,223,202 - Choi , et al. December 29, 2
2015-12-29
Alignment method for semiconductor processing
Grant 8,514,374 - Bailey , et al. August 20, 2
2013-08-20
Pattern recognition with edge correction for design based metrology
Grant 8,495,527 - Bailey , et al. July 23, 2
2013-07-23
Pattern recognition with edge correction for design based metrology
Grant 8,429,570 - Bailey , et al. April 23, 2
2013-04-23
Method of enhancing photoresist adhesion to rare earth oxides
Grant 8,415,212 - Schaeffer , et al. April 9, 2
2013-04-09
System and method for semiconductor device fabrication using modeling
Grant 8,359,562 - Sarma , et al. January 22, 2
2013-01-22
Stray light feedback for dose control in semiconductor lithography systems
Grant 8,330,937 - Marokkey , et al. December 11, 2
2012-12-11
System and Method for Semiconductor Device Fabrication Using Modeling
App 20120179282 - Sarma; Chandrasekhar ;   et al.
2012-07-12
Pattern Recognition with Edge Correction for Design Based Metrology
App 20120110522 - Bailey; Todd C. ;   et al.
2012-05-03
Pattern Recognition With Edge Correction For Design Based Metrology
App 20120110523 - Bailey; Todd C. ;   et al.
2012-05-03
Device for holding a template for use in imprint lithography
Grant 8,033,814 - Bailey , et al. October 11, 2
2011-10-11
Method of Enhancing Photoresist Adhesion to Rare Earth Oxides
App 20110223756 - Schaeffer; James K. ;   et al.
2011-09-15
Mask forming and implanting methods using implant stopping layer
Grant 7,998,871 - Babich , et al. August 16, 2
2011-08-16
Alignment Method For Semiconductor Processing
App 20110102760 - Bailey; Todd C. ;   et al.
2011-05-05
Variable fill and cheese for mitigation of BEOL topography
Grant 7,926,006 - Bailey , et al. April 12, 2
2011-04-12
Device for holding a template for use in imprint lithography
Grant 7,708,542 - Bailey , et al. May 4, 2
2010-05-04
Mask forming and implanting methods using implant stopping layer and mask so formed
Grant 7,651,947 - Babich , et al. January 26, 2
2010-01-26
Stray Light Feedback for Dose Control in Semiconductor Lithography Systems
App 20090284726 - Marokkey; Sajan ;   et al.
2009-11-19
Stray light feedback for dose control in semiconductor lithography systems
Grant 7,583,362 - Marokkey , et al. September 1, 2
2009-09-01
Imprint Lithography Templates Having Alignment Marks
App 20090214689 - Bailey; Todd C. ;   et al.
2009-08-27
Ribs for line collapse prevention in damascene structures
Grant 7,514,356 - Marokkey , et al. April 7, 2
2009-04-07
Mask Forming And Implanting Methods Using Implant Stopping Layer
App 20090004869 - Babich; Katherina ;   et al.
2009-01-01
Mask Having Implant Stopping Layer
App 20080286545 - Babich; Katherina ;   et al.
2008-11-20
Variable Fill And Cheese For Mitigation Of Beol Topography
App 20080203589 - Bailey; Todd C. ;   et al.
2008-08-28
Imprint lithography system to produce light to impinge upon and polymerize a liquid in superimposition with template overlay marks
Grant 7,303,383 - Sreenivasan , et al. December 4, 2
2007-12-04
Bottom Anti-reflective Coating
App 20070275330 - Bailey; Todd C. ;   et al.
2007-11-29
Mask Forming And Implanting Methods Using Implant Stopping Layer And Mask So Formed
App 20070275563 - Babich; Katherina ;   et al.
2007-11-29
Imprint Lithography System To Produce Light To Impinge Upon And Polymerize A Liquid In Superimposition With Template Overlay Marks
App 20070264588 - Sreenivasan; Sidlgata V. ;   et al.
2007-11-15
Imprint lithography template having a feature size under 250 nm
Grant 7,229,273 - Bailey , et al. June 12, 2
2007-06-12
Method of determining alignment of a template and a substrate having a liquid disposed therebetween
Grant 7,186,483 - Sreenivasan , et al. March 6, 2
2007-03-06
Ribs for line collapse prevention in damascene structures
App 20060199369 - Marokkey; Sajan ;   et al.
2006-09-07
Method for performing chemical shrink process over BARC (bottom anti-reflective coating)
Grant 7,083,898 - Bailey , et al. August 1, 2
2006-08-01
System And Method For Wireless Ip Address Capacity Optimization
App 20060153118 - Bailey; Todd C.
2006-07-13
Release layer comprising diamond-like carbon (DLC) or doped DLC with tunable composition for imprint lithography templates and contact masks
App 20060145398 - Bailey; Todd C. ;   et al.
2006-07-06
Stray light feedback for dose control in semiconductor lithography systems
App 20060110666 - Marokkey; Sajan ;   et al.
2006-05-25
Imprint lithography templates having alignment marks
App 20050064344 - Bailey, Todd C. ;   et al.
2005-03-24

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