Bahr; Detlef
Patent Applications and Registrations
Patent applications and USPTO patent grants for Bahr; Detlef.The latest application filed is for "method of adjusting the primary side of an x-ray diffractometer".
- Bahr; Detlef - Karlsruhe DE
| Patent | Date |
|---|---|
| Method of adjusting the primary side of an X-ray diffractometer Grant 10,598,615 - Kleine , et al. | 2020-03-24 |
| Method Of Adjusting The Primary Side Of An X-ray Diffractometer App 20170160212 - KLEINE; Andreas ; et al. | 2017-06-08 |
| X-ray optical system and method for imaging a source Grant 6,925,147 - Lange , et al. August 2, 2 | 2005-08-02 |
| X-ray optical system with collimator in the focus of an X-ray mirror Grant 6,898,270 - Lange , et al. May 24, 2 | 2005-05-24 |
| X-ray diffractometer Grant 6,665,372 - Bahr , et al. December 16, 2 | 2003-12-16 |
| X-ray optical system with collimator in the focus of an X-ray mirror App 20030112923 - Lange, Joachim ; et al. | 2003-06-19 |
| X-ray optical system and method for imaging a source App 20030108153 - Lange, Joachim ; et al. | 2003-06-12 |
| X-ray diffractometer App 20030043965 - Bahr, Detlef ; et al. | 2003-03-06 |
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