| Patent | Date |
|---|
Scan compression architecture for highly compressed designs and associated methods
Grant 10,354,742 - Bahl , et al. July 16, 2 | 2019-07-16 |
Scan Compression Architecture For Highly Compressed Designs And Associated Methods
App 20170140838 - Bahl; Swapnil ; et al. | 2017-05-18 |
Scan compression architecture for highly compressed designs and associated methods
Grant 9,606,180 - Bahl , et al. March 28, 2 | 2017-03-28 |
Synchronous on-chip clock controllers
Grant 9,264,049 - Bahl , et al. February 16, 2 | 2016-02-16 |
Monitoring on-chip clock control during integrated circuit testing
Grant 9,234,938 - Khullar , et al. January 12, 2 | 2016-01-12 |
Scan Compression Architecture For Highly Compressed Designs And Associated Methods
App 20150323593 - BAHL; Swapnil ; et al. | 2015-11-12 |
Monitoring On-chip Clock Control During Integrated Circuit Testing
App 20150323594 - KHULLAR; Shray ; et al. | 2015-11-12 |
Synchronous On-chip Clock Controllers
App 20150137862 - Bahl; Swapnil ; et al. | 2015-05-21 |
Integrated circuit with reduced power consumption in a test mode, and related methods
Grant 8,917,123 - Bahl , et al. December 23, 2 | 2014-12-23 |
Integrated Circuit With Reduced Power Consumption In A Test Mode, And Related Methods
App 20140292385 - BAHL; SWAPNIL ; et al. | 2014-10-02 |
Sequential on-chip clock controller with dynamic bypass for multi-clock domain testing
Grant 8,775,857 - Khullar , et al. July 8, 2 | 2014-07-08 |
Testing of multi-clock domains
Grant 8,527,824 - Bahl , et al. September 3, 2 | 2013-09-03 |
Testing Of Multi-clock Domains
App 20130159802 - BAHL; Swapnil ; et al. | 2013-06-20 |
Method and apparatus for testing of a memory with redundancy elements
Grant 8,458,545 - Roy , et al. June 4, 2 | 2013-06-04 |
Testing of multi-clock domains
Grant 8,381,051 - Bahl , et al. February 19, 2 | 2013-02-19 |
Sequential On-chip Clock Controller With Dynamic Bypass For Multi-clock Domain Testing
App 20120166860 - Khullar; Shray ; et al. | 2012-06-28 |
Method And Apparatus For Testing Of A Memory With Redundancy Elements
App 20120137188 - Roy; Tanmoy ; et al. | 2012-05-31 |
Testing Of Multi-clock Domains
App 20110264971 - Bahl; Swapnil ; et al. | 2011-10-27 |
Self programmable shared bist for testing multiple memories
Grant 7,814,385 - Bahl October 12, 2 | 2010-10-12 |
On-chip storage memory for storing variable data bits
Grant 7,372,755 - Bahl , et al. May 13, 2 | 2008-05-13 |
On-chip and at-speed tester for testing and characterization of different types of memories
Grant 7,353,442 - Bahl , et al. April 1, 2 | 2008-04-01 |
Self Programmable Shared Bist For Testing Multiple Memories
App 20080059850 - Bahl; Swapnil | 2008-03-06 |
Configurable length first-in first-out memory
Grant 7,321,520 - Bahl , et al. January 22, 2 | 2008-01-22 |
Configurable length first-in first-out memory
App 20060256636 - Bahl; Swapnil ; et al. | 2006-11-16 |
On-chip and at-speed tester for testing and characterization of different types of memories
App 20050246602 - Bahl, Swapnil ; et al. | 2005-11-03 |
On-chip storage memory for storing variable data bits
App 20050232028 - Bahl, Swapnil ; et al. | 2005-10-20 |
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