loadpatents
name:-0.008620023727417
name:-0.007580041885376
name:-0.0047578811645508
Baer; Adam Patent Filings

Baer; Adam

Patent Applications and Registrations

Patent applications and USPTO patent grants for Baer; Adam.The latest application filed is for "on-tool wavefront aberrations measurement system and method".

Company Profile
0.7.6
  • Baer; Adam - Rehovot IL
  • Baer; Adam - Kfar Uriyah IL
  • Baer; Adam - Kfar Urivah IL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
On-tool wavefront aberrations measurement system and method
Grant 9,395,266 - Golberg , et al. July 19, 2
2016-07-19
On-tool Wavefront Aberrations Measurement System And Method
App 20150300913 - Golberg; Boris ;   et al.
2015-10-22
Inspection system and method for fast changes of focus
Grant 8,659,754 - Feldman , et al. February 25, 2
2014-02-25
Inspection System And Method For Fast Changes Of Focus
App 20130342893 - Feldman; Haim ;   et al.
2013-12-26
Inspection system and method for fast changes of focus
Grant 8,488,117 - Feldman , et al. July 16, 2
2013-07-16
Inspection of EUV masks by a DUV mask inspection tool
Grant 8,207,504 - Braude , et al. June 26, 2
2012-06-26
Inspection System And Method For Fast Changes Of Focus
App 20120086937 - Feldman; Haim ;   et al.
2012-04-12
Inspection Of Euv Masks By A Duv Mask Inspection Tool
App 20110121193 - Braude; Chaim ;   et al.
2011-05-26
System for inspecting a surface employing configurable multi angle illumination modes
Grant 7,315,364 - Baer , et al. January 1, 2
2008-01-01
Determination of irradiation parameters for inspection of a surface
Grant 7,239,389 - Baer , et al. July 3, 2
2007-07-03
Determination of irradiation parameters for inspection of a surface
App 20060244976 - Baer; Adam ;   et al.
2006-11-02
System for inspecting a surface employing configurable multi angle illumination modes
App 20060087648 - Baer; Adam ;   et al.
2006-04-27

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