| Patent | Date |
|---|
Using a differential memory storage architecture for updating a memory area
Grant 10,599,350 - Kern , et al. | 2020-03-24 |
Systems and methods utilizing a flexible read reference for a dynamic read window
Grant 10,319,460 - Kern , et al. | 2019-06-11 |
Resistive memory transition monitoring
Grant 10,311,955 - Backhausen , et al. | 2019-06-04 |
Apparatus and method for correcting at least one bit error within a coded bit sequence
Grant 10,200,065 - Kern , et al. Fe | 2019-02-05 |
Resistive Memory Transition Monitoring
App 20180350434 - Backhausen; Ulrich ; et al. | 2018-12-06 |
Updating A Memory
App 20180307424 - Kern; Thomas ; et al. | 2018-10-25 |
Marker programming in non-volatile memories
Grant 10,067,826 - Rabenalt , et al. September 4, 2 | 2018-09-04 |
Resistive memory transition monitoring
Grant 10,056,145 - Backhausen , et al. August 21, 2 | 2018-08-21 |
Resistive Memory Transition Monitoring
App 20170256315 - Backhausen; Ulrich ; et al. | 2017-09-07 |
System and method to emulate an electrically erasable programmable read-only memory
Grant 9,569,354 - Backhausen , et al. February 14, 2 | 2017-02-14 |
Memory timing circuit
Grant 9,489,994 - Jefremow , et al. November 8, 2 | 2016-11-08 |
Marker Programming In Non-volatile Memories
App 20160306696 - Rabenalt; Thomas ; et al. | 2016-10-20 |
Apparatus and method for error correction and error detection
Grant 9,450,613 - Kern , et al. September 20, 2 | 2016-09-20 |
Marker programming in non-volatile memories
Grant 9,405,618 - Rabenalt , et al. August 2, 2 | 2016-08-02 |
System and method for emulating an EEPROM in a non-volatile memory device
Grant 9,389,999 - Kern , et al. July 12, 2 | 2016-07-12 |
Memory Timing Circuit
App 20160148662 - Jefremow; Mihail ; et al. | 2016-05-26 |
Word line address scan
Grant 9,343,179 - Nirschl , et al. May 17, 2 | 2016-05-17 |
Memory timing circuit
Grant 9,281,032 - Jefremow , et al. March 8, 2 | 2016-03-08 |
Marker Programming in Non-Volatile Memories
App 20150347227 - Rabenalt; Thomas ; et al. | 2015-12-03 |
Circuitry and method for correcting 3-bit errors containing adjacent 2-bit error
Grant 9,203,437 - Kern , et al. December 1, 2 | 2015-12-01 |
Memory Timing Circuit
App 20150294700 - Jefremow; Mihail ; et al. | 2015-10-15 |
Method and System for Reducing the Size of Nonvolatile Memories
App 20150179270 - Kern; Thomas ; et al. | 2015-06-25 |
Word Line Address Scan
App 20150170762 - Nirschl; Thomas ; et al. | 2015-06-18 |
Apparatus and method for comparing pairs of binary words
Grant 8,966,355 - Kern , et al. February 24, 2 | 2015-02-24 |
Systems And Methods Utilizing A Flexible Read Reference For A Dynamic Read Window
App 20150052387 - Kern; Thomas ; et al. | 2015-02-19 |
System and Method to Emulate an Electrically Erasable Programmable Read-Only Memory
App 20150039805 - Backhausen; Ulrich ; et al. | 2015-02-05 |
Apparatus And Method For Error Correction And Error Detection
App 20150007001 - Kern; Thomas ; et al. | 2015-01-01 |
Method and device for programming data into non-volatile memories
Grant 8,913,435 - Backhausen , et al. December 16, 2 | 2014-12-16 |
Apparatus and method for detecting an error within a coded binary word
Grant 8,898,535 - Kern , et al. November 25, 2 | 2014-11-25 |
Device and method for testing a circuit to be tested
Grant 8,856,629 - Kern , et al. October 7, 2 | 2014-10-07 |
Method and System for Reducing the Complexity of Electronically Programmable Nonvolatile Memory
App 20140241055 - Backhausen; Ulrich ; et al. | 2014-08-28 |
Method and System for Reducing the Size of Nonvolatile Memories
App 20140198583 - Kern; Thomas ; et al. | 2014-07-17 |
Circuitry and Method for Correcting 3-bit Errors Containing Adjacent 2-Bit Error
App 20140173386 - Kern; Thomas ; et al. | 2014-06-19 |
Device And Method For Testing A Circuit To Be Tested
App 20140075272 - Kern; Thomas ; et al. | 2014-03-13 |
System And Method For Emulating An Eeprom In A Non-volatile Memory Device
App 20140052896 - Kern; Thomas ; et al. | 2014-02-20 |
Apparatus And Method For Correcting At Least One Bit Error Within A Coded Bit Sequence
App 20130346834 - Kern; Thomas ; et al. | 2013-12-26 |
Self timed current integrating scheme employing level and slope detection
Grant 8,559,243 - Jefremow , et al. October 15, 2 | 2013-10-15 |
Apparatus and method for correcting at least one bit error within a coded bit sequence
Grant 8,539,321 - Kern , et al. September 17, 2 | 2013-09-17 |
Method and apparatus for storing data
Grant 8,533,566 - Backhausen , et al. September 10, 2 | 2013-09-10 |
Apparatus and Method for Comparing Pairs of Binary Words
App 20130212452 - Kern; Thomas ; et al. | 2013-08-15 |
Apparatus and Method for Detecting an Error Within a Coded Binary Word
App 20120144260 - Kern; Thomas ; et al. | 2012-06-07 |
Self Timed Current Integrating Scheme Employing Level And Slope Detection
App 20120126783 - Jefremow; Mihail ; et al. | 2012-05-24 |
Apparatus and Method for Correcting at least one Bit Error within a Coded Bit Sequence
App 20120117448 - Kern; Thomas ; et al. | 2012-05-10 |
Method And Device For Programming Data Into Non-volatile Memories
App 20120069673 - Backhausen; Ulrich ; et al. | 2012-03-22 |
Method and Apparatus for Storing Data
App 20110191658 - Backhausen; Ulrich ; et al. | 2011-08-04 |
Apparatus and Method for Detecting an Error Within a Plurality of Coded Binary Words Coded by an Error Correction Code
App 20110138249 - Kern; Thomas ; et al. | 2011-06-09 |
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