Babulnath; Raghav
Patent Applications and Registrations
Patent applications and USPTO patent grants for Babulnath; Raghav.The latest application filed is for "creating defect samples for array regions".
- Babulnath; Raghav - San Jose CA
| Patent | Date |
|---|---|
| Inspection for multiple process steps in a single inspection process Grant 10,712,289 - Baris , et al. | 2020-07-14 |
| Creating defect samples for array regions Grant 10,620,134 - Anantha , et al. | 2020-04-14 |
| Creating Defect Samples for Array Regions App 20190346375 - Anantha; Vidyasagar ; et al. | 2019-11-14 |
| Defect detection and classification based on attributes determined from a standard reference image Grant 10,127,652 - Gao , et al. November 13, 2 | 2018-11-13 |
| Sub-pixel alignment of inspection to design Grant 9,996,942 - Bhattacharyya , et al. June 12, 2 | 2018-06-12 |
| Dynamic design attributes for wafer inspection Grant 9,865,512 - Jayaraman , et al. January 9, 2 | 2018-01-09 |
| Adaptive nuisance filter Grant 9,835,566 - Liang , et al. December 5, 2 | 2017-12-05 |
| Repeater detection Grant 9,766,187 - Chen , et al. September 19, 2 | 2017-09-19 |
| Design Based Sampling and Binning for Yield Critical Defects App 20170103517 - Kurada; Satya ; et al. | 2017-04-13 |
| Based sampling and binning for yield critical defects Grant 9,563,943 - Kurada , et al. February 7, 2 | 2017-02-07 |
| Sub-Pixel Alignment of Inspection to Design App 20160275672 - Bhattacharyya; Santosh ; et al. | 2016-09-22 |
| Adaptive Nuisance Filter App 20160258879 - Liang; Ardis ; et al. | 2016-09-08 |
| Design Based Sampling and Binning for Yield Critical Defects App 20160225138 - Kurada; Satya ; et al. | 2016-08-04 |
| Based sampling and binning for yield critical defects Grant 9,310,320 - Kurada , et al. April 12, 2 | 2016-04-12 |
| Repeater Detection App 20160061745 - Chen; Hong ; et al. | 2016-03-03 |
| Inspection for Multiple Process Steps in a Single Inspection Process App 20160033420 - Baris; Oksen Toros ; et al. | 2016-02-04 |
| Defect Detection And Classification Based On Attributes Determined From A Standard Reference Image App 20150221076 - Gao; Lisheng ; et al. | 2015-08-06 |
| Detecting IC Reliability Defects App 20150120220 - Wu; Joanne ; et al. | 2015-04-30 |
| Design Based Sampling and Binning for Yield Critical Defects App 20140307947 - Kurada; Satya ; et al. | 2014-10-16 |
| Dynamic Design Attributes For Wafer Inspection App 20140303921 - Jayaraman; Thirupurasundari ; et al. | 2014-10-09 |
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