AZUMA; Junzo

Patent Applications and Registrations

Patent applications and USPTO patent grants for AZUMA; Junzo.The latest application filed is for "sample holder and charged particle beam apparatus".

Company Profile

1.10.8

AZUMA; Junzo - Tokyo JP
AZUMA; Junzo - Minato-ku Tokyo
Azuma; Junzo - Hitachiota N/A JP
Azuma; Junzo - Hitachiohta N/A JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Sample Holder and Charged Particle Beam Apparatus App 20220277923 - HANEDA; Shigeru ; et al.	2022-09-01
Cross-section Observation Device, And Control Method App 20200111639 - MAN; XIN ; et al.	2020-04-09
Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatus Grant 9,099,281 - Yaguchi , et al. August 4, 2	2015-08-04
Specified position identifying method and specified position measuring apparatus Grant 8,442,300 - Tsuneta , et al. May 14, 2	2013-05-14
Charged particle beam apparatus using an electrostatic lens gun Grant 8,399,863 - Kaga , et al. March 19, 2	2013-03-19
Charged Particle Radiation Apparatus, and Method for Displaying Three-Dimensional Information in Charged Particle Radiation Apparatus App 20120212583 - Yaguchi; Toshie ; et al.	2012-08-23
Charged Particle Gun And Focused Ion Beam Apparatus Using The Gun App 20110186745 - Kqaga; Hiroyasu ; et al.	2011-08-04
Specified position identifying method and specified position measuring apparatus App 20070274593 - Tsuneta; Ruriko ; et al.	2007-11-29
Probe driving method, and probe apparatus Grant 7,301,146 - Tomimatsu , et al. November 27, 2	2007-11-27
Probe driving method, and probe apparatus App 20050269511 - Tomimatsu, Satoshi ; et al.	2005-12-08
Apparatus for inspecting defects of devices and method of inspecting defects Grant 6,970,004 - Ishitani , et al. November 29, 2	2005-11-29
Probe driving method, and probe apparatus Grant 6,960,765 - Tomimatsu , et al. November 1, 2	2005-11-01
Apparatus for inspecting defects of devices and method of inspecting defects App 20040178811 - Ishitani, Tohru ; et al.	2004-09-16
Apparatus for detecting defect in device and method of detecting defect Grant 6,734,687 - Ishitani , et al. May 11, 2	2004-05-11
Probe driving method, and probe apparatus App 20030184332 - Tomimatsu, Satoshi ; et al.	2003-10-02

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