Awaji; Toshiaki
Patent Applications and Registrations
Patent applications and USPTO patent grants for Awaji; Toshiaki.The latest application filed is for "differential signal transmitting apparatus and a test apparatus".
- Awaji; Toshiaki - Tokyo JP
- Awaji; Toshiaki - Nerima-ku JP
- Awaji; Toshiaki - Gyoda JP
| Patent | Date |
|---|---|
| Differential signal transmitting apparatus and a test apparatus Grant 7,965,092 - Nakamura , et al. June 21, 2 | 2011-06-21 |
| Driver circuit and test apparatus Grant 7,962,110 - Kamo , et al. June 14, 2 | 2011-06-14 |
| Test apparatus, pin electronics card, electrical device and switch Grant 7,876,120 - Awaji , et al. January 25, 2 | 2011-01-25 |
| Driver circuit and test apparatus Grant 7,755,377 - Kamo , et al. July 13, 2 | 2010-07-13 |
| Test apparatus and test method with features of adjusting phase difference between data and reference clock and acquiring adjusted data Grant 7,707,484 - Awaji , et al. April 27, 2 | 2010-04-27 |
| Differential Signal Transmitting Apparatus And A Test Apparatus App 20100001776 - NAKAMURA; TAKAYUKI ; et al. | 2010-01-07 |
| Driver circuit and test apparatus Grant 7,589,549 - Kamo , et al. September 15, 2 | 2009-09-15 |
| Driver Circuit And Test Apparatus App 20090209210 - Kamo; Kensuke ; et al. | 2009-08-20 |
| Electronic device, circuit and test apparatus Grant 7,557,561 - Awaji , et al. July 7, 2 | 2009-07-07 |
| Test Apparatus And Test Method App 20090158103 - Awaji; Toshiaki ; et al. | 2009-06-18 |
| Test apparatus, pin electronics card, electrical device and switch App 20090134900 - AWAJI; TOSHIAKI ; et al. | 2009-05-28 |
| Driver circuit, test apparatus and adjusting method Grant 7,538,582 - Matsumoto , et al. May 26, 2 | 2009-05-26 |
| Driver Circuit And Test Apparatus App 20090128182 - KAMO; KENSUKE ; et al. | 2009-05-21 |
| Driver Circuit And Test Apparatus App 20090128181 - Kamo; Kensuke ; et al. | 2009-05-21 |
| Test apparatus and test method Grant 7,512,872 - Awaji , et al. March 31, 2 | 2009-03-31 |
| Terminator circuit, test apparatus, test head, and communication device Grant 7,459,897 - Awaji , et al. December 2, 2 | 2008-12-02 |
| Test device and setting method Grant 7,453,932 - Awaji , et al. November 18, 2 | 2008-11-18 |
| Testing apparatus for testing a device under test and comparator circuit and calibration apparatus for the testing apparatus Grant 7,389,190 - Umemura , et al. June 17, 2 | 2008-06-17 |
| Test apparatus and test method App 20080120059 - Awaji; Toshiaki ; et al. | 2008-05-22 |
| Electronic Device, Circuit And Test Apparatus App 20070262800 - Awaji; Toshiaki ; et al. | 2007-11-15 |
| Terminator circuit, test apparatus, test head, and communication device App 20070257658 - Awaji; Toshiaki ; et al. | 2007-11-08 |
| Driver circuit, test apparatus and adjusting method App 20070103198 - Matsumoto; Naoki ; et al. | 2007-05-10 |
| Sampling circuit Grant 7,208,982 - Yamakawa , et al. April 24, 2 | 2007-04-24 |
| Calibration comparator circuit App 20060267637 - Umemura; Yoshiharu ; et al. | 2006-11-30 |
| Differential comparator circuit, test head, and test apparatus Grant 7,123,025 - Awaji , et al. October 17, 2 | 2006-10-17 |
| Sampling circuit App 20060097898 - Yamakawa; Masahiro ; et al. | 2006-05-11 |
| Differential comparator circuit, test head, and test apparatus App 20060033509 - Awaji; Toshiaki ; et al. | 2006-02-16 |
| Test device and setting method App 20050243906 - Awaji, Toshiaki ; et al. | 2005-11-03 |
| Connector Grant 6,257,933 - Awaji July 10, 2 | 2001-07-10 |
| Driver circuit for semiconductor test system Grant 5,699,001 - Awaji , et al. December 16, 1 | 1997-12-16 |
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