AUERBACH; Ditza
Patent Applications and Registrations
Patent applications and USPTO patent grants for AUERBACH; Ditza.The latest application filed is for "monitoring system".
- AUERBACH; Ditza - Aseret IL
| Patent | Date |
|---|---|
| Monitoring System App 20200260998 - AUERBACH; Ditza ; et al. | 2020-08-20 |
| Motion monitor Grant 10,506,952 - Auerbach Dec | 2019-12-17 |
| Body Motion Monitor App 20190133499 - AUERBACH; Ditza | 2019-05-09 |
| Motion Monitor App 20170367625 - AUERBACH; Ditza | 2017-12-28 |
| Motion monitor Grant 9,788,762 - Auerbach October 17, 2 | 2017-10-17 |
| Method for providing high resolution, high contrast fused MRI images Grant 9,720,065 - Rapoport , et al. August 1, 2 | 2017-08-01 |
| Motion Monitor App 20160235344 - AUERBACH; Ditza | 2016-08-18 |
| Method For Providing High Resolution, High Contrast Fused Mri Images App 20150077105 - Rapoport; Uri ; et al. | 2015-03-19 |
| System and method for generating spatial signatures Grant 8,553,970 - Auerbach October 8, 2 | 2013-10-08 |
| System and method for generating spatial signatures App 20130051653 - Auerbach; Ditza | 2013-02-28 |
| System and method for generating spatial signatures Grant 8,254,661 - Auerbach August 28, 2 | 2012-08-28 |
| Wafer defect detection system and method Grant 8,255,172 - Auerbach August 28, 2 | 2012-08-28 |
| Method for filtering nuisance defects Grant 7,844,100 - Auerbach November 30, 2 | 2010-11-30 |
| Wafer Defect Detection System And Method App 20100076699 - Auerbach; Ditza | 2010-03-25 |
| System And Method For Generating Spatial Signatures Reference To Related Applications App 20090324055 - Auerbach; Ditza | 2009-12-31 |
| Determination of irradiation parameters for inspection of a surface Grant 7,239,389 - Baer , et al. July 3, 2 | 2007-07-03 |
| Determination of irradiation parameters for inspection of a surface App 20060244976 - Baer; Adam ; et al. | 2006-11-02 |
| Method for filtering nuisance defects App 20060115143 - Auerbach; Ditza | 2006-06-01 |
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