ATTAL; Shay
Patent Applications and Registrations
Patent applications and USPTO patent grants for ATTAL; Shay.The latest application filed is for "image acquisition by an electron beam examination tool for metrology measurement".
- ATTAL; Shay - Rehovot IL
| Patent | Date |
|---|---|
| Image Acquisition By An Electron Beam Examination Tool For Metrology Measurement App 20220099592 - SKARIA; Bobin Mathew ; et al. | 2022-03-31 |
| System and methods of generating comparable regions of a lithographic mask Grant 11,263,741 - Cohen , et al. March 1, 2 | 2022-03-01 |
| System And Methods Of Generating Comparable Regions Of A Lithographic Mask App 20210233220 - Cohen; Boaz ; et al. | 2021-07-29 |
| Overlay monitoring Grant 11,054,753 - Kaplan , et al. July 6, 2 | 2021-07-06 |
| Evaluating an object Grant 10,504,693 - Attal , et al. Dec | 2019-12-10 |
| Evaluating An Object App 20190088444 - Attal; Shay ; et al. | 2019-03-21 |
| System and method for printability based inspection Grant 9,927,375 - Attal , et al. March 27, 2 | 2018-03-27 |
| System And Method For Printability Based Inspection App 20170176347 - Attal; Shay ; et al. | 2017-06-22 |
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